Microscopy Microanalysis Microstructures

Investigation of metal cluster layers by EELS

Hellmut Seiler, Ulrich Haas, Karl-Heinz Körtje and Bernd Ocker

Microsc. Microanal. Microstruct., 2 2-3 (1991) 191-201

DOI: 10.1051/mmm:0199100202-3019100

Hellmut Seiler

Ulrich Haas

Karl-Heinz Körtje

Bernd Ocker

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