Microscopy Microanalysis Microstructures

Automated processing of parallel-detection EELS data

Michael K. Kundmann and Ondrej L. Krivanek

Microsc. Microanal. Microstruct., 2 2-3 (1991) 245-256

DOI: 10.1051/mmm:0199100202-3024500

Michael K. Kundmann

Ondrej L. Krivanek

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