Microscopy Microanalysis Microstructures

CBED strain measurements in boron implanted silicon

Roberto Balboni and Stefano Frabboni

Microsc. Microanal. Microstruct., 2 6 (1991) 617-626

DOI: 10.1051/mmm:0199100206061700

Roberto Balboni

Stefano Frabboni

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