Microscopy Microanalysis Microstructures

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Analysis of MBE growth and atomic exchange in thin highly strained InAs layers

C. d'Anterroches and J.M. Gerard

Microsc. Microanal. Microstruct., 5 3 (1994) 213-236

DOI: 10.1051/mmm:0199400503021300

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C. d'Anterroches

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