Microscopy Microanalysis Microstructures

SEM, ToF-SIMS and LFM morphological study of an heterogeneous polymeric surface

Bernard Nysten, Geert Verfaillie, Etienne Ferain, Roger Legras, Jean-Benoit Lhoest, Claude Poleunis and Patrick Bertrand

Microsc. Microanal. Microstruct., 5 4-6 (1994) 373-380

DOI: 10.1051/mmm:0199400504-6037300

Bernard Nysten

Geert Verfaillie

Etienne Ferain

Roger Legras

Jean-Benoit Lhoest

Claude Poleunis

Patrick Bertrand

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