Microscopy Microanalysis Microstructures

PSTM : An alternative to measure local variation of optical index

Dominique Barchiesi and Daniel Van Labeke

Microsc. Microanal. Microstruct., 5 4-6 (1994) 435-446

DOI: 10.1051/mmm:0199400504-6043500

Dominique Barchiesi

Daniel Van Labeke

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