Microscopy Microanalysis Microstructures

Electrostatic forces between a metallic tip and semiconductor surfaces

Sylvain Hudlet, Michel Saint Jean, Bernard Roulet, Jacques Berger and Claudine Guthmann

Microsc. Microanal. Microstruct., 5 4-6 (1994) 467-476

DOI: 10.1051/mmm:0199400504-6046700

Sylvain Hudlet

Michel Saint Jean

Bernard Roulet

Jacques Berger

Claudine Guthmann

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