Microscopy Microanalysis Microstructures

In Situ EELS and TEM Observation of Boron Carbide During Hydrogen- and Helium-Ion Bombardments

Kouhei N. Kushita, Kiichi Hojou and Shigemi Furuno

Microsc. Microanal. Microstruct., 6 1 (1995) 149-157

DOI: 10.1051/mmm:1995115

Kouhei N. Kushita

Kiichi Hojou

Shigemi Furuno

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