Microscopy Microanalysis Microstructures

Low-Loss EELS Study of Oxide-Covered Aluminum Nanospheres

Thomas Stöckli, Pierre Stadelmann and André Châtelain

Microsc. Microanal. Microstruct., 8 2 (1997) 145-155

DOI: 10.1051/mmm:1997113

Thomas Stöckli

Pierre Stadelmann

André Châtelain

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