Microscopy Microanalysis Microstructures

Elastic Stress Relaxation in HRTEM Specimens of Strained Semiconductor Heterostructures and its Influence on the Image Contrast

Liberato De Caro, Antonino Giuffrida, Elvio Carlino and Leander Tapfer

Microsc. Microanal. Microstruct., 6 5-6 (1995) 465-472

DOI: 10.1051/mmm:1995137

Liberato De Caro

Antonino Giuffrida

Elvio Carlino

Leander Tapfer

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