Free Access Editorial Editorial - About a summer-school "Concepts and image interpretation in near-field microscopy" Oléron, France (4-8 October 1991) p. I Sebastien Gauthier and Christian Joachim DOI: https://doi.org/10.1051/mmm:0199100206056700 PDF (117.2 KB)
Free Access Energy-filtered HREM images of valence-loss electrons p. 569 Zhong Lin Wang and James Bentley DOI: https://doi.org/10.1051/mmm:0199100206056900 PDF (2.016 MB)References
Free Access Study of FeCl3 and CoCl2 graphite intercalation compounds reduced by heavy alkali metal vapour p. 589 Claire Herold, Jean François Marêchée and Guy Furdin DOI: https://doi.org/10.1051/mmm:0199100206058900 PDF (1.596 MB)References
Free Access Comportement dissymétrique des dislocations entre traction et compression dans des superalliages base-nickel p. 603 Brigitte Décamps, Marc Condat and Allan J. Morton DOI: https://doi.org/10.1051/mmm:0199100206060300 PDF (2.141 MB)References
Free Access CBED strain measurements in boron implanted silicon p. 617 Roberto Balboni and Stefano Frabboni DOI: https://doi.org/10.1051/mmm:0199100206061700 PDF (1.266 MB)References
Free Access Experimental image processing of small supported metallic particles (1-3 nm) p. 627 Suzanne Giorgio, Geneviève Nihoul, Claude Chapon and Claude R. Henry DOI: https://doi.org/10.1051/mmm:0199100206062700 PDF (1.018 MB)References
Free Access Theoretical image processing of simulated supported particles (1-3 nm) p. 637 Geneviève Nihoul DOI: https://doi.org/10.1051/mmm:0199100206063700 PDF (1.304 MB)References
Free Access Scanning force microscopy - With Applications to Electric, Magnetic and Atomic Forces p. 649 Dror Sarid, Roland Coratger, François Ajustron and Jacques Beauvillain DOI: https://doi.org/10.1051/mmm:0199100206064900 PDF (144.0 KB)References
