Free Access
| Issue |
Microsc. Microanal. Microstruct.
Volume 2, Number 6, December 1991
|
|
|---|---|---|
| Page(s) | 649 - 649 | |
| DOI | https://doi.org/10.1051/mmm:0199100206064900 | |
Microsc. Microanal. Microstruct. 2, 649-649 (1991)
DOI: 10.1051/mmm:0199100206064900
1 Optical Sciences Center, University of Arizona, Tucson Arizona, U.S.A.
2 CEMES - LOE, CNRS, Toulouse
PACS
0130V - Book reviews.
Key words
Book review -- Scanning force microscopy -- Scanning tunneling microscopy -- Atomic force microscopy -- Magnetic force microscopy
© EDP Sciences 1991
DOI: 10.1051/mmm:0199100206064900
Scanning force microscopy - With Applications to Electric, Magnetic and Atomic Forces
Dror Sarid1, Roland Coratger2, François Ajustron2 et Jacques Beauvillain21 Optical Sciences Center, University of Arizona, Tucson Arizona, U.S.A.
2 CEMES - LOE, CNRS, Toulouse
Without abstract
PACS
0130V - Book reviews.
Key words
Book review -- Scanning force microscopy -- Scanning tunneling microscopy -- Atomic force microscopy -- Magnetic force microscopy
© EDP Sciences 1991
First page of the article
