Free Access
Microsc. Microanal. Microstruct.
Volume 4, Number 1, February 1993
Page(s) 23 - 39
Microsc. Microanal. Microstruct. 4, 23-39 (1993)
DOI: 10.1051/mmm:019930040102300

Spatially resolved electron energy-loss near-edge structure analysis of a near Σ = 11 tilt boundary in sapphire

John Bruley

Max-Planck-Institut für Metallforschung, Institut für Werkstoffwissenschaft, Seestraße 92, D-7000 Stuttgart 1, Germany

Spatially resolved electron energy-loss spectra have been recorded from the same E = 11 grain boundary of a high purity sapphire (α - Al 2O3) bi-crystal that had previously been examined by high resolution electron microscopy. The energy-loss near-edge structure (ELNES) on the aluminium L2,3 edge of the bulk α - Al2O3 is consistent with previously published X-ray absorption near-edge spectra (XANES). The presence of the grain-boundary introduces additional fine structure on the L2,3 edge, which is extracted from the dominant bulk spectrum using the chemical-standard "difference" method. A comparison with various spectral "fingerprints" suggests that the structural environment of the Al cations within the boundary plane has a reduced point-group symmetry and coordination number. Quantitative analyses of spectral intensities indicate that the equivalent of a full monolayer of Al cations is involved in the structural change at the boundary. These experimental observations are consistent with a recently calculated low energy relaxed grain-boundary structure.

6172M - Grain and twin boundaries.

Key words
Experimental study -- Crystal structure -- Bicrystals -- Tilt boundary -- EEL spectroscopy -- Sapphire -- Aluminium oxides -- Structure of liquids -- Structure of solids -- Crystallography -- Condensed matter physics -- Materials science -- Physics -- Condensed state physics -- Inorganic compounds

© EDP Sciences 1993