Free Access
Editorial
| Issue |
Microsc. Microanal. Microstruct.
Volume 4, Number 5, October 1993
|
|
|---|---|---|
| Page(s) | I - I | |
| DOI | https://doi.org/10.1051/mmm:01993004050R100 | |
Microsc. Microanal. Microstruct. 4, I-I (1993)
DOI: 10.1051/mmm:01993004050R100
1 CEMES-LOE-CNRS, (Toulouse)
2 Ecole Centrale (Ecully)
3 GPEC, Luminy (Marseille)
PACS
0779 - Scanning probe microscopes and components.
0130 - Physics literature and publications.
Key words
Scanning probe microscopy -- High-resolution methods -- Surface analysis -- Roughness -- Soft material -- Biological compound -- Editorial -- Symposium
© EDP Sciences 1993
DOI: 10.1051/mmm:01993004050R100
Editorial : Cercle français des microscopies à champ proche
J. Beauvillain1, L. Porte2 et F. Salvan31 CEMES-LOE-CNRS, (Toulouse)
2 Ecole Centrale (Ecully)
3 GPEC, Luminy (Marseille)
Without abstract
PACS
0779 - Scanning probe microscopes and components.
0130 - Physics literature and publications.
Key words
Scanning probe microscopy -- High-resolution methods -- Surface analysis -- Roughness -- Soft material -- Biological compound -- Editorial -- Symposium
© EDP Sciences 1993
First page of the article
