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Volume 8 / No 2 (April 1997)

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Microscopy Microanalysis Microstructures

Volume 8 / No 2 (April 1997)

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One Hundred Years of the Electron p. V

Peter Hawkes

DOI: https://doi.org/10.1051/mmm:01997008020R500

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HREM Image Analysis by Fourier Filtering of Reflections with Long Extinction Distances: Application to the Spinel/MgO System p. 89

Reinald Hillebrand, Peter Werner, Heino Sieber and Dietrich Hesse

DOI: https://doi.org/10.1051/mmm:1997108

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Atomic Scale Imaging and Analysis of T' Precipitates in Al-Mg-Zn Alloys p. 103

Annabelle Bigot, Pierre Auger, Sylvain Chambreland, Didier Blavette and Andrew Reeves

DOI: https://doi.org/10.1051/mmm:1997109

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Shape Reconstruction of Partially Overlapping Objects in SEM Images: Application to Silver Halide Microcrystals p. 115

Volodymyr V. Kindratenko, Boris A. Treiger and Pierre J. M. Van Espen

DOI: https://doi.org/10.1051/mmm:1997110

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Influence of Imaging Parameters and Specimen Thinning on Strain Measurements in Au/Ni MBE Multilayers by HREM Image Processing p. 125

Pascale Bayle-Guillemaud and Jany Thibault

DOI: https://doi.org/10.1051/mmm:1997111

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Stability of Interfaces in Gold-Silicon System Regarding Equilibrium Segregation p. 137

Andrée Rolland, Christophe Poisson, Francois M. d'Heurle and Ahmed Charaï

DOI: https://doi.org/10.1051/mmm:1997112

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Low-Loss EELS Study of Oxide-Covered Aluminum Nanospheres p. 145

Thomas Stöckli, Pierre Stadelmann and André Châtelain

DOI: https://doi.org/10.1051/mmm:1997113