Free Access
| Issue |
Microsc. Microanal. Microstruct.
Volume 8, Number 2, April 1997
|
|
|---|---|---|
| Page(s) | 137 - 143 | |
| DOI | https://doi.org/10.1051/mmm:1997112 | |
References of Microsc. Microanal. Microstruct. 8 137-143
- Hiraki A., Nicolet M.-A. and Mayer J.W., Appl. Phys. Lett. 18 (1971) 178. [CrossRef]
- Cros A. and Muret P., Mat. Sci. Rpt. 8(67) (1992) and references herein.
- Baumann F.H. and Schröter W., Phys. Rev. B 43 (1991) 6510.
- Rolland A., Bernardini J. and Charaï A., Elec. Micros. Vol 2 EUREM 921-GRANADA (1992) p. 737.
- Allen L.H., Philipps J.R., Theodore D., Carter C.B., Soave R., Mayer J.W. and Ottaviani G., Phys. Rev. B 41 (1990) 8203.
- Nygren S. and d'Heurle F.M., Solid State Phenomena 23&24 (1992) 81.
- Castanet R., Chastel R. and Bergman C., Mater. Sci. Eng. 53 (1978) 93.
- Jacobson D.C., Poate J.M. and Olson G.L., Appl. Phys. Lett. 40 (1986) 118. [CrossRef]
- Barthés M.G. and Rolland A., Thin Solid Film 76 (1981) 45. [CrossRef]
- Cabané F. and Cabané J., in "Interface segregation and Related Process in Solid" , J. Novotny, Ed., Vol. 1 (Trans. Tech., Zurich 1991).