Free Access
| Issue |
Microsc. Microanal. Microstruct.
Volume 2, Number 4, August 1991
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|---|---|---|
| Page(s) | 475 - 481 | |
| DOI | https://doi.org/10.1051/mmm:0199100204047500 | |
References of Microsc. Microanal. Microstruct. 2 475-481
- Ball M.D. , Mccartney D.G. , The measurement of atomic number and composition in a SEM using backscattered detectors, J. Microsc. 124 (1981) n° 1.
- Danguy L. , Quivy R. , Rétrodiffusion des electrons par les solutions et les alliages. J. Phys. Radium 16 (1956 ) 320. [CrossRef]
- Castaing R. , The fundamentals of electron probe analysis , Adv. X-Ray Anal. 4 ( 1960) 351.
- Herrmann R. and Reimer L. , Backscattering coefficient of multicomponent specimens, Scanning 6 ( 1984) 20.
- Degreve F. , Dubost B. , Dubus A. , Thorne N.A. , Bodart E. and Demortier G. , Quantitative analysis of intermetallic phases in Al-Li alloys by electron, ion and nuclear microprobes, Proc. of AlLi IV Congress, Paris (June 1987).