Free Access
| Issue |
Microsc. Microanal. Microstruct.
Volume 6, Number 1, February 1995
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|---|---|---|
| Page(s) | 79 - 88 | |
| DOI | https://doi.org/10.1051/mmm:1995108 | |
References of Microsc. Microanal. Microstruct. 6 79-88
- Maskasky J.E., J. Imag. Sci. 31 (1987) 15.
- Gao X.-L., Gijbels R., Nys B., Jacob W., Gilliams Y., J. Imag. Sci. 33 (1989) 87.
- Maternaghan T.J., Falder C.J., Levi-Setti R. and Shabala J.M., J. Imag. Sci. 34 (1990) 58.
- Goessens C., Schryvers D., Van Landuyt J., Amelinckx S., Verbeeck A. and De Keyzer R., J. Cryst. Growth 110 (1991) 930. [CrossRef]
- Geuens I., Gijbels R., Jacob W., Verbeeck A. and De Keyzer R., J. Imag. Sci. Techn. 36 (1992) 534.
- Black D.L. and Timmons J.A., Imag. Sci. Techn. 38 (1994) 10.
- Lavergne J.L., Gimenez C., Friour G. and Martin J.M., In Proc. Intern. Congr. Phot. Sci. ICPS'94/IS7T's 47th Ann. Conf Vol. 1 (Rochester, New York, 1994) p. 31.
- Lavergne J.L., Gimenez C., Friour G. and Martin J.M., In Proc. 13th Intern. Congr. Electr. Microscopy, B. Jouffrey and C. Colliex Eds., Vol. 1 (Les Editions de Physique, Les Ulis, France, 1994) p. 629.
- Oleshko V. and Alfimov M., Imag. Sci. Techn. 38 (1994) 162.
- Maskasky J.E., J. Imag. Sci. 31 (1987) 93.
- Tan Y.T., J. Chem. Soc. Faraday Trans. 2 (1989) 457.
- Malis T., Cheng S.C. and Egerton R.F., J. Electr. Microsc. Tech. 8 (1988) 193. [CrossRef]
- Egerton R.F., Electron Energy-Loss Spectroscopy in the Electron Microscope (Plenum Press, New York and London, 1986).
- Raether H., Excitation of Plasmons and Interband Transitions by Electrons, Springer Tracts in Modern Physics, Vol. 88 (Springer-Verlag, New York, 1980).