Free Access
Issue |
Microsc. Microanal. Microstruct.
Volume 8, Number 1, February 1997
|
|
---|---|---|
Page(s) | 41 - 57 | |
DOI | https://doi.org/10.1051/mmm:1997105 |
References of Microsc. Microanal. Microstruct. 8 41-57
- Duffieux P.-M., L'intégrale de Fourier et ses applications à l'optique (Les Imprimeries Oberthur, Rennes, 1946).
- Gabor D., Proc. Inst. Electr. Eng. 93 (1946) 429.
- Zak J., Phys. Rev. 168 (1968) 686. [CrossRef]
- Zak J., Solid State Phys. 27 (1972) 1.
- Bastiaans M.J., Appl. Opt. 33 (1994) 5241.
- Htch M.J., in "Scanning Microscopy Supplement 10: Signal and Image Processing in Microscopy and Microanalysis" , P. Hawkes, Ed. (Scanning Microscopy International, Chicago, 1996).
- Htch M.J. and Gandais M., Philos. Mag. A 72 (1995) 619. [CrossRef]
- de Ruijter W.J. and Weiss J.K., Ultramicroscopy 50 (1993) 269. [CrossRef]
- Volk E., Allard L.F., Datye A. and Frost B., Ultramicroscopy 58 (1995) 97. [CrossRef]
- Saxton W.O., Pitt T.J. and Horner M., Ultramicroscopy 4 (1979) 343. [CrossRef]
- Scheerschmidt K. and Knoll F., Phys. Stat. Sol. (a) 146 (1994) 491. [CrossRef]
- Ricolleau C., Loiseau A. and Ducastelle F., Phase Transitions 30 (1991) 243. [CrossRef]
- Htch M.J. and Potez L., Philos. Mag. A (1997) accepted.
- Smith D.J., Saxton W.O., O'Keefe M.A., Woods G.J. and Stobbs W.M., Ultramicroscopy 11 (1983) 263. [CrossRef]
- Htch M.J., Redlich P. and Ajayan P., in "Proc. European Electron Microscopy Meeting", EUREM 96 (Dublin, 1996).
- Htch M.J., Redlich P. and Ajayan P., Phys. Rev. B, submitted (1996).
- Hiura H., Ebbesen T.W., Fujita J., Tanigaki K. and Takada T., Nature 367 (1994) 148. [CrossRef]
- Bierwolf R., Hohenstein H., Philipp F., Brandt O., Crook G.E. and Ploog K., Ultramicroscopy 49 (1993) 273. [CrossRef]
- Jouneau P.H., Tardot A., Feuillet B., Mariette H. and Cibert J., J. Appl. Phys. 75 (1994) 7310. [CrossRef]
- Bayle P., Deutsch T., Gilles B., Lançon F., Marty A. and Thibault J., Ultramicroscopy 56 (1994) 94. [CrossRef]
- Htch M.J. and Bayle P., in " 13th International Conference on Electron Microscopy" (Les Éditions de Physique, Les Ulis, 1994) Vol. 2A, pp. 129-30.
- Treacy M.M.J. and Gibson J.M., J. Vac. Sci. Technol. B 4 (1986) 1458. [CrossRef]