Free Access
Issue |
Microsc. Microanal. Microstruct.
Volume 8, Number 6, December 1997
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Page(s) | 355 - 368 | |
DOI | https://doi.org/10.1051/mmm:1997127 |
References of Microsc. Microanal. Microstruct. 8 355-368
- Keller D.J. and Chou C.-C., Surf. Sci. 268 (1992) 333. [CrossRef]
- Fink H.W., Phys. Scr. 38 (1988) 260. [CrossRef]
- Binh V.T. and Garcia N., Ultramicroscopy 42-44 (1992) 80. [CrossRef]
- Baptist R., Proc. 7th Int. Vacuum Microelectronics Conf., Grenoble (Société Française du Vide, Paris, 1994).
- Rinzler A.S., Hafner J.H., Nikolaev P., Lou L., Kim S.G., Tomanek D., Nordlander P., Colbert D.T. and Smalley R.E., Science 269 (1995) 1150.
- De Heer W.A., Châtelain A. and Ugarte D., Science 270 (1995) 1179. [CrossRef]
- Randi M.R., Monteverde F.T. and Valdrè U., J. Supercond. Sci. Technol. 7 (1994) 507. [CrossRef]
- Hart K.R., Kassner T.F. and Maurin J.K., Phil. Mag. 21 (1970) 453. [CrossRef]
- Hirsch P., Kässens M., Püttmann M. and Reimer L., Scanning 16 (1994) 101.
- Sentimenti A., Thesis, no. 2091, Università degli Studi, Bologna, 1995.
- Antognozzi M. and Valdrè U., Microsc. Microanal. Microstruct. 6 (1995) 513. [CrossRef] [EDP Sciences]
- Binh V.T., Garcia N. and Purcell S.T., Adv. Imag. Elec. Phys. 95 (1996) 63.