The parameterless correction method in X-ray microanalysis
Microsc. Microanal. Microstruct., 1 1 (1990) 1-22
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H. LEROUX, J. C. DOUKHAN and A. BISCHOFFMeteoritics & Planetary Science 32 (3) 365 (1997)
https://doi.org/10.1111/j.1945-5100.1997.tb01279.x
Microstructures and iron partitioning in (Mg,Fe)SiO3 perovskite‐(Mg,Fe)O magnesiowüstite assemblages: An analytical transmission electron microscopy study
Isabelle Martinez, Yanbin Wang, Francois Guyot, Robert C. Liebermann and Jean‐Claude DoukhanJournal of Geophysical Research: Solid Earth 102 (B3) 5265 (1997)
https://doi.org/10.1029/96JB03188
https://doi.org/10.1002/9783527620524.ch5
An analytical electron microscopy (AEM) investigation of opaque inclusions in some type 6 ordinary chondrites
Hugues LEROUX, Jean‐Claude DOUKHAN and François GUYOTMeteoritics & Planetary Science 31 (6) 767 (1996)
https://doi.org/10.1111/j.1945-5100.1996.tb02111.x
Transmission Electron Microscopy
David B. Williams and C. Barry CarterTransmission Electron Microscopy 597 (1996)
https://doi.org/10.1007/978-1-4757-2519-3_35
Absorption correction and thickness determination using the ζ factor in quantitative X-ray microanalysis
Masashi Watanabe, Zenji Horita and Minoru NemotoUltramicroscopy 65 (3-4) 187 (1996)
https://doi.org/10.1016/S0304-3991(96)00070-8
Report on the 1993 and 1994 Round Robin EDXS Tests of the Ile de France TEM Network
Danièle Bouchet and Jannick IngrinMicroscopy Microanalysis Microstructures 6 (4) 385 (1995)
https://doi.org/10.1051/mmm:1995128