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Cited article:

Quantitative EELS by Spectrum Parametrization

Abdelaziz Aitouchen, Yolande Kihn and Gérald Zanchi
Microscopy Microanalysis Microstructures 8 (6) 369 (1997)
https://doi.org/10.1051/mmm:1997128

An efficient method for calculating the least‐squares background fit in electron energy‐loss spectroscopy

A. L. D. BECKERS, E. S. GELSEMA and W. C. DE BRUIJN
Journal of Microscopy 171 (1) 87 (1993)
https://doi.org/10.1111/j.1365-2818.1993.tb03361.x

Quantification procedures for electron energy‐loss spectroscopy and imaging: the use of correspondence analysis for element determination

E. S. Gelsema, A. L. D. Beckers, C. W. J. Sorber and W. C. De Bruijn
Journal of Microscopy 166 (3) 287 (1992)
https://doi.org/10.1111/j.1365-2818.1992.tb01528.x