The Citing articles tool gives a list of articles citing the current article. The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).
Probing semiconductor interfaces by transmission electron microscopy
Philosophical Transactions of the Royal Society of London. Series A: Physical and Engineering Sciences 344(1673) 545 (1993) https://doi.org/10.1098/rsta.1993.0107
Atomic structure images formed by core loss electrons
H. Hashimoto, Y. Makita and N. Nagaoka Proceedings, annual meeting, Electron Microscopy Society of America 50(2) 1194 (1992) https://doi.org/10.1017/S0424820100130602
Design and applications of a post-column imaging filter
O.L. Krivanek, A.J. Gubbens, N. Dellby and C.E. Meyer Proceedings, annual meeting, Electron Microscopy Society of America 50(2) 1192 (1992) https://doi.org/10.1017/S0424820100130596
Design and first applications of a post-column imaging filter
Ondrej L. Krivanek, Alexander J. Gubbens, Niklas Dellby and Christopher E. Meyer Microscopy Microanalysis Microstructures 3(2-3) 187 (1992) https://doi.org/10.1051/mmm:0199200302-3018700
Parallel EELS elemental mapping in scanning transmission electron microscopy: use of the difference methods