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Cited article:

Commercial spectrometer modifications for energy filtering of electron diffraction patterns and images

R. Holmestad, O.L. Krivanek, R. Høier, K. Marthinsen and J.C.H. Spence
Ultramicroscopy 52 (3-4) 454 (1993)
https://doi.org/10.1016/0304-3991(93)90060-B

Electron optical analysis of a retarding Wien filter for electron spectroscopic imaging

K. Tsuno
Review of Scientific Instruments 64 (3) 659 (1993)
https://doi.org/10.1063/1.1144193

In-situ observation of movement of atoms and identification of thorium atoms by core-loss electron imaging

Y. Makita, H. Hashimoto, N. Nagaoka and A. Kumao
Microscopy Microanalysis Microstructures 4 (2-3) 143 (1993)
https://doi.org/10.1051/mmm:0199300402-3014300

Probing semiconductor interfaces by transmission electron microscopy

Philosophical Transactions of the Royal Society of London. Series A: Physical and Engineering Sciences 344 (1673) 545 (1993)
https://doi.org/10.1098/rsta.1993.0107

Energy-filtered imaging in biological intermediate voltage TEM

A.J. Gubbens and O.L. Krivanek
Proceedings, annual meeting, Electron Microscopy Society of America 50 (2) 1570 (1992)
https://doi.org/10.1017/S0424820100132480

Atomic structure images formed by core loss electrons

H. Hashimoto, Y. Makita and N. Nagaoka
Proceedings, annual meeting, Electron Microscopy Society of America 50 (2) 1194 (1992)
https://doi.org/10.1017/S0424820100130602

Design and applications of a post-column imaging filter

O.L. Krivanek, A.J. Gubbens, N. Dellby and C.E. Meyer
Proceedings, annual meeting, Electron Microscopy Society of America 50 (2) 1192 (1992)
https://doi.org/10.1017/S0424820100130596

Design and first applications of a post-column imaging filter

Ondrej L. Krivanek, Alexander J. Gubbens, Niklas Dellby and Christopher E. Meyer
Microscopy Microanalysis Microstructures 3 (2-3) 187 (1992)
https://doi.org/10.1051/mmm:0199200302-3018700

Parallel EELS elemental mapping in scanning transmission electron microscopy: use of the difference methods

Gérard Balossier, Xavier Thomas, Jean Michel, et al.
Microscopy Microanalysis Microstructures 2 (5) 531 (1991)
https://doi.org/10.1051/mmm:0199100205053100