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Advances in ultrahigh-energy resolution EELS: phonons, infrared plasmons and strongly coupled modes
Maureen J Lagos, Isobel C Bicket, S Shayan Mousavi M. and Gianluigi A Botton Microscopy 71(Supplement_1) i174 (2022) https://doi.org/10.1093/jmicro/dfab050
A new monochromator with multiple offset cylindrical lenses
Takashi Ogawa and Boklae Cho Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 772 5 (2015) https://doi.org/10.1016/j.nima.2014.10.075
A new monochromator with multiple offset cylindrical lenses 2: Aberration analysis and its applications
Takashi Ogawa and Boklae Cho Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 800 18 (2015) https://doi.org/10.1016/j.nima.2015.08.009
Bonding Behavior and Chemical Stability of Silica-Based Nanotubes and Their 3D Assembly
Teresa Dennenwaldt, Stefan J. Sedlmaier, Andreas Binek, Wolfgang Schnick and Christina Scheu The Journal of Physical Chemistry C 118(16) 8416 (2014) https://doi.org/10.1021/jp500408x
Practical aspects of monochromators developed for transmission electron microscopy
Microscopy, Spectroscopy, Holography and Crystallography with Electrons
Bernard Jouffrey, Peter Schattschneider and Cécile Hébert Advances in Imaging and Electron Physics, Microscopy, Spectroscopy, Holography and Crystallography with Electrons 123 413 (2002) https://doi.org/10.1016/S1076-5670(02)80072-6
Construction and characterization of the fringe field monochromator for a field emission gun
Optics and design of the fringe field monochromator for a Schottky field emission gun
H.W Mook and P Kruit Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 427(1-2) 109 (1999) https://doi.org/10.1016/S0168-9002(98)01511-3
On the monochromatisation of high brightness electron sources for electron microscopy
Structure analysis of defects in nanometer space inside a crystal: Creation and agglomeration of point defects in Si and Ge revealed by high-resolution electron microscopy
A new high-resolution Electron Energy-Loss Spectroscopy microscope
Michiyoshi Tanaka, Masami Terauchi, Ryuichi Kuzuo, et al. Proceedings, annual meeting, Electron Microscopy Society of America 50(2) 940 (1992) https://doi.org/10.1017/S0424820100129334