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Microelastic properties of minimally adhesive surfaces: A comparative study of RTV11™ and Intersleek elastomers™
Fernando Terán Arce, Recep Avci, Iwona B. Beech, Keith E. Cooksey and Barbara Wigglesworth-Cooksey The Journal of Chemical Physics 119(3) 1671 (2003) https://doi.org/10.1063/1.1582435
Surface treatment of polycarbonate films aimed at biomedical application
Laurence Kessler, Gilbert Legeay, Arnaud Coudreuse, et al. Journal of Biomaterials Science, Polymer Edition 14(10) 1135 (2003) https://doi.org/10.1163/156856203769231619
Sample Metallization for Performance Improvement in Desorption/Ionization of Kilodalton Molecules: Quantitative Evaluation, Imaging Secondary Ion MS, and Laser Ablation
A. Delcorte, J. Bour, F. Aubriet, J.-F. Muller and P. Bertrand Analytical Chemistry 75(24) 6875 (2003) https://doi.org/10.1021/ac0302105
ToF‐SIMS for the characterization of hyperbranched aliphatic polyesters: probing their molecular weight on surfaces based on principal component analysis (PCA)
Géraldine Coullerez, Stefan Lundmark, Eva Malmström, Anders Hult and Hans Jörg Mathieu Surface and Interface Analysis 35(8) 693 (2003) https://doi.org/10.1002/sia.1592
Tribology of plane strain compression tests on aluminium strip using ToF-SIMS analysis of transfer films
Gold-thiolate cluster emission from SAMs under keV ion bombardment: Experiments and molecular dynamics simulations
B. Arezki, A. Delcorte, A.C. Chami, B.J. Garrison and P. Bertrand Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 212 369 (2003) https://doi.org/10.1016/S0168-583X(03)01457-5
Static SIMS analysis of carbonate on basic alkali‐bearing surfaces
A. D. Shaw, M. M. Cortez, A. K. Gianotto, A. D. Appelhans, J. E. Olson, C. Karahan, R. Avci and G. S. Groenewold Surface and Interface Analysis 35(3) 310 (2003) https://doi.org/10.1002/sia.1534
Cationization of dendritic macromolecule adsorbates on metals studied by time‐of‐flight secondary ion mass spectrometry
Géraldine Coullerez, Hans Jörg Mathieu, Stefan Lundmark, Michael Malkoch, Heléne Magnusson and Anders Hult Surface and Interface Analysis 35(8) 682 (2003) https://doi.org/10.1002/sia.1591
Effect of Local Matrix Crystal Variations in Matrix-Assisted Ionization Techniques for Mass Spectrometry
Stefan L. Luxembourg, Liam A. McDonnell, Marc C. Duursma, Xinghua Guo and Ron M. A. Heeren Analytical Chemistry 75(10) 2333 (2003) https://doi.org/10.1021/ac026434p
Sputtering kilodalton fragments from polymers
A Delcorte, B Arezki, P Bertrand and B.J Garrison Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 193(1-4) 768 (2002) https://doi.org/10.1016/S0168-583X(02)00902-3
Organic Secondary Ion Mass Spectrometry: Sensitivity Enhancement by Gold Deposition
Kinetic energy distributions of molecular and cluster ions sputtered from self-assembled monolayers of octanethiol on gold
Bahia Arezki, Arnaud Delcorte and Patrick Bertrand Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 193(1-4) 755 (2002) https://doi.org/10.1016/S0168-583X(02)00899-6
Tandem time-of-flight mass spectrometer (TOF-TOF) with a quadratic-field ion mirror
Anastassios E. Giannakopulos, Benjamin Thomas, Alex W. Colburn, et al. Review of Scientific Instruments 73(5) 2115 (2002) https://doi.org/10.1063/1.1470229
Enhanced TOF-SIMS Imaging of a Micropatterned Protein by Stable Isotope Protein Labeling
Anna M. Belu, Zhongping Yang, Ryan Aslami and Ashutosh Chilkoti Analytical Chemistry 73(2) 143 (2001) https://doi.org/10.1021/ac000771l
ToF–SIMS study of organosilane self-assembly on aluminum surfaces
APPLICATIONS OF X-RAY PHOTOELECTRON SPECTROSCOPY AND STATIC SECONDARY ION MASS SPECTROMETRY IN SURFACE CHARACTERIZATION OF COPOLYMERS AND POLYMERS BLENDS
Molecular Imaging of a Micropatterned Biological Ligand on an Activated Polymer Surface
Zhongping Yang, Anna M. Belu, Andrea Liebmann-Vinson, Harry Sugg and Ashutosh Chilkoti Langmuir 16(19) 7482 (2000) https://doi.org/10.1021/la0000623
Inferring ejection distances and a surface energy profile in keV particle bombardment experiments
A Delcorte, B.G Segda, B.J Garrison and P Bertrand Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 171(3) 277 (2000) https://doi.org/10.1016/S0168-583X(00)00263-9
Surface functionalization of PEEK films studied by time-of-flight secondary ion mass spectrometry and x-ray photoelectron spectroscopy
Kinetic energy distribution of molecular fragments sputtered from poly(ethylene terephthalate) under indium ion bombardment: effects of the primary beam energy and angle
A. Delcorte, X. Vanden Eynde, P. Bertrand and D.F. Reich Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 157(1-4) 138 (1999) https://doi.org/10.1016/S0168-583X(99)00452-8
Generation of Ternary Pr−Mo−O Oxides by Solid State Reactions between Oxide Powders under Ultrasonic Stirring
Frédéric De Smet, Michel Devillers, Etienne Ferain, Claude Poleunis and Patrick Bertrand Chemistry of Materials 11(2) 324 (1999) https://doi.org/10.1021/cm980551c
Round robin of time-of-flight secondary ion mass spectrometry damage studies of a photoimmobilized reagent on diamond surfaces designed for surface glycoengineering
Influence of the primary ion beam parameters (nature, energy, and angle) on the kinetic energy distribution of molecular fragments sputtered from poly(ethylene terephthalate) by kiloelectron volt ions
Bulk and Surface Quantification of a Biodegradable and -medical Copolyester
F.-R. Lang, D. Léonard, H. J. Mathieu, E. M. Moser and P. Bertrand Macromolecules 31(18) 6177 (1998) https://doi.org/10.1021/ma980059e
Influence of chemical structure and beam degradation on the kinetic energy of molecular secondary ions in keV ion sputtering of polymers
A Delcorte and P Bertrand Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 135(1-4) 430 (1998) https://doi.org/10.1016/S0168-583X(97)00652-6
Part 1.N-(m-(3-(trifluoromethyl)diazirine-3-yl)phenyl)-4-maleimido-butyramide (MAD) on silicon, silicon nitride and diamond
Polyelectrolyte multilayers containing photoreactive groups
André Laschewsky, Erik Wischerhoff, Patrick Bertrand and Arnaud Delcorte Macromolecular Chemistry and Physics 198(10) 3239 (1997) https://doi.org/10.1002/macp.1997.021981021
Polymer metallization: Low energy ion beam surface modification to improve adhesion
Determination of trace metallic impurities on 200-mm silicon wafers by time-of-flight secondary-ion-mass spectroscopy
Paul K. Chu, Bruno W. Schueler, Fraser Reich and Patricia M. Lindley Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 15(6) 1908 (1997) https://doi.org/10.1116/1.589577
A new plasma-based method to promote cell adhesion on micrometric tracks on polystyrene substrates
J.-B. Lhoest, E. Detrait, J.-L. Dewez, P. Van Den Bosch De Aguilar and P. Bertrand Journal of Biomaterials Science, Polymer Edition 7(12) 1039 (1996) https://doi.org/10.1163/156856296X00534
Energy distributions of hydrocarbon secondary ions from thin organic films under keV ion bombardment: Correlation between kinetic and formation energy of ions sputtered from tricosenoic acid
A. Delcorte and P. Bertrand Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 117(3) 235 (1996) https://doi.org/10.1016/0168-583X(96)00306-0
Time-of-flight SIMS study of BiMo selective oxidation catalysts
Time-of-flight SIMS and in-situ XPS study of O2 and O2-N2 post-discharge microwave plasma-modified high-density polyethylene and hexatriacontane surfaces
Kinetic energy distributions of secondary molecular ions from thin organic films under ion bombardment
A. Delcorte and P. Bertrand Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 115(1-4) 246 (1996) https://doi.org/10.1016/0168-583X(95)01563-9
Adhesion study of SiOx / PET films: comparison between scratch test and fragmentation test
PMMA surface modification under keV and MeV ion bombardment in relation to mammalian cell adhesion
J.-B. Lhoest, J.-L. Dewez and P. Bertrand Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 105(1-4) 322 (1995) https://doi.org/10.1016/0168-583X(95)00524-2
Direct Surface Analysis of Organic Contamination for Semiconductor Related Materials
Physical, chemical and electrochemical characterization of heat-treated tetracarboxylic cobalt phthalocyanine adsorbed on carbon black as electrocatalyst for oxygen reduction in polymer electrolyte fuel cells