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This article has been cited by the following article(s):
Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) study of SF6 and SF6–CF4 plasma‐treated low‐density polyethylene films
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Secondary molecular ion emission from aliphatic polymers bombarded with low energy ions: Effects of the molecular structure and the ion beam induced surface degradation
A. Delcorte, L.T. Weng and P. Bertrand Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 100(2-3) 213 (1995) https://doi.org/10.1016/0168-583X(94)00842-6
ToF SIMS study of the desorption of emulsifiers from polystyrene latexes
L. T. Weng, P. Bertrand, J. H. Stone‐Masui and W. E. E. Stone Surface and Interface Analysis 21(6-7) 387 (1994) https://doi.org/10.1002/sia.740210611
Surface Analysis Of Lcd Materials iN Various Stages of Production by Time-of-Flight Secondary Ion Mass Spectroscopy (TOF-SIMS)