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Cited article:

Microscope imaging by time-of-flight secondary ion mass spectrometry

Bruno W. Schueler

Microsc. Microanal. Microstruct., 3 2-3 (1992) 119-139

DOI: https://doi.org/10.1051/mmm:0199200302-3011900

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Secondary molecular ion emission from aliphatic polymers bombarded with low energy ions: Effects of the molecular structure and the ion beam induced surface degradation

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Multi-Technique Characterization of WSix films

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SEM, ToF-SIMS and LFM morphological study of an heterogeneous polymeric surface

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Microscopy Microanalysis Microstructures 5 (4-6) 373 (1994)
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