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Cited article:

Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) study of SF6 and SF6–CF4 plasma‐treated low‐density polyethylene films

D. Léonard, P. Bertrand, Y. Khairallah‐Abdelnour, F. Arefi‐Khonsari and J. Amouroux
Surface and Interface Analysis 23 (7-8) 467 (1995)
https://doi.org/10.1002/sia.740230706

On the role of molecular photofragmentation during depth profiling of tantalum oxide layers by laser SNMS

A. Wucher, K. Franzreb, H.‐J. Mathieu and D. Landolt
Surface and Interface Analysis 23 (12) 844 (1995)
https://doi.org/10.1002/sia.740231207

SEM, ToF-SIMS and LFM morphological study of an heterogeneous polymeric surface

Bernard Nysten, Geert Verfaillie, Etienne Ferain, et al.
Microscopy Microanalysis Microstructures 5 (4-6) 373 (1994)
https://doi.org/10.1051/mmm:0199400504-6037300

ToF SIMS study of the desorption of emulsifiers from polystyrene latexes

L. T. Weng, P. Bertrand, J. H. Stone‐Masui and W. E. E. Stone
Surface and Interface Analysis 21 (6-7) 387 (1994)
https://doi.org/10.1002/sia.740210611

Surface Analysis Of Lcd Materials iN Various Stages of Production by Time-of-Flight Secondary Ion Mass Spectroscopy (TOF-SIMS)

J.J. Lee, P.M. Lindley and R.W. Odom
MRS Proceedings 345 (1994)
https://doi.org/10.1557/PROC-345-197

Multi-Technique Characterization of WSix films

S.M. Baumann, C.J. Hitzman, I.C. Ivanov, AY. Craig and P.M. Lindley
MRS Proceedings 337 (1994)
https://doi.org/10.1557/PROC-337-675