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This article has been cited by the following article(s):
Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) study of SF6 and SF6–CF4 plasma‐treated low‐density polyethylene films
D. Léonard, P. Bertrand, Y. Khairallah‐Abdelnour, F. Arefi‐Khonsari and J. Amouroux Surface and Interface Analysis 23(7-8) 467 (1995) https://doi.org/10.1002/sia.740230706
On the role of molecular photofragmentation during depth profiling of tantalum oxide layers by laser SNMS