The Citing articles tool gives a list of articles citing the current article. The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program . You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).
Cited article:
Jean-Louis Lavergne , Jean-Michel Martin , Michel Belin
Microsc. Microanal. Microstruct., 3 6 (1992) 517-528
This article has been cited by the following article(s):
77 articles
Radiation-induced structure of austenitic steels with different nickel content under neutron irradiation in SM-3 and BOR-60 reactors
E. A. Kuleshova, S. V. Fedotov, D. A. Maltsev, et al. Voprosy Materialovedeniya (4(112)) 121 (2023) https://doi.org/10.22349/1994-6716-2022-112-4-121-155
From early to present and future achievements of EELS in the TEM
Christian Colliex The European Physical Journal Applied Physics 97 38 (2022) https://doi.org/10.1051/epjap/2022220012
Principles of Electron Optics, Volume 4
Principles of Electron Optics, Volume 4 2489 (2022) https://doi.org/10.1016/B978-0-323-91646-2.00086-4
Profile evaluation of the ion irradiation-induced swelling in austenitic stainless steel with varying nickel content
E. A. Kuleshova, D. A. Maltsev, A. S. Frolov, et al. Voprosy Materialovedeniya (2(110)) 171 (2022) https://doi.org/10.22349/1994-6716-2022-110-2-171-184
Elemental mapping of labelled biological specimens at intermediate energy loss in an energy‐filtered TEM acquired using a direct detection device
Ranjan Ramachandra, Mason R. Mackey, Junru Hu, Steven T. Peltier, Nguyen‐Huu Xuong, Mark H. Ellisman and Stephen R. Adams Journal of Microscopy 283 (2) 127 (2021) https://doi.org/10.1111/jmi.13014
Microstructure degradation of austenitic stainless steels after 45 years of operation as VVER-440 reactor internals
E.A. Kuleshova, S.V. Fedotova, B.A. Gurovich, et al. Journal of Nuclear Materials 533 152124 (2020) https://doi.org/10.1016/j.jnucmat.2020.152124
Three dimensional resistance mapping of self-organized Sr3V2O8 nanorods on metallic perovskite SrVO3 matrix
Rosine Coq Germanicus, Yoan Bourlier, Vincent Notot, et al. Applied Surface Science 510 145522 (2020) https://doi.org/10.1016/j.apsusc.2020.145522
Comparison of the high Ni VVER-1000 weld microstructure under the primary irradiation and re-irradiation
E.A. Kuleshova, B.A. Gurovich, S.V. Fedotova, et al. Journal of Nuclear Materials 540 152384 (2020) https://doi.org/10.1016/j.jnucmat.2020.152384
Ranjan Ramachandra, Mason R. Mackey, Junru Hu, Steven T. Peltier, Nguyen-Huu Xuong, Mark H. Ellisman and Stephen R. Adams (2020) https://doi.org/10.1101/2020.11.02.365940
Investigation of irradiated metal of WWER-type reactor internals after 45 years of operation. Part 3. Microstructure and phase composition
E. A. Kuleshova, S. V. Fedotova, B. A. Gurovich, et al. Voprosy Materialovedeniya (3(103)) 157 (2020) https://doi.org/10.22349/1994-6716-2020-103-3-157-180
Springer Handbook of Microscopy
Gianluigi Botton and Sagar Prabhudev Springer Handbooks, Springer Handbook of Microscopy 345 (2019) https://doi.org/10.1007/978-3-030-00069-1_7
Characterisation of Li in the surface film of a corrosion resistant Mg-Li(-Al-Y-Zr) alloy
Y. Yan, Y. Qiu, O. Gharbi, N. Birbilis and P.N.H. Nakashima Applied Surface Science 494 1066 (2019) https://doi.org/10.1016/j.apsusc.2019.07.167
Reference Module in Chemistry, Molecular Sciences and Chemical Engineering
Vladimir P. Oleshko Reference Module in Chemistry, Molecular Sciences and Chemical Engineering (2018) https://doi.org/10.1016/B978-0-12-409547-2.14406-3
From a physicist's toy to an indispensable analytical tool in many fields of science
Christian Colliex Ultramicroscopy 180 14 (2017) https://doi.org/10.1016/j.ultramic.2016.11.007
Jie Zhu, Yi Qiang Shen and Si Ping Zhao 86 (2016) https://doi.org/10.1109/IPFA.2016.7564254
Transmission Electron Microscopy
Paul Thomas and Paul Midgley Transmission Electron Microscopy 377 (2016) https://doi.org/10.1007/978-3-319-26651-0_13
Gentle quantitative measurement of helium density in nanobubbles in silicon by spectrum imaging
Kévin Alix, Marie-Laure David, Guillaume Lucas, et al. Micron 77 57 (2015) https://doi.org/10.1016/j.micron.2015.05.011
Nanocharacterisation
Matthew Weyland and Paul A. Midgley Nanocharacterisation 211 (2015) https://doi.org/10.1039/9781782621867-00211
Energy filtering transmission electron microscopy and atomistic simulations of tribo-induced hybridization change of nanocrystalline diamond coating
M.I. De Barros Bouchet, C. Matta, B. Vacher, et al. Carbon 87 317 (2015) https://doi.org/10.1016/j.carbon.2015.02.041
The SmartEFTEM-SI method: Development of a new spectrum-imaging acquisition scheme for quantitative mapping by energy-filtering transmission electron microscopy
Masashi Watanabe and Frances I. Allen Ultramicroscopy 113 106 (2012) https://doi.org/10.1016/j.ultramic.2011.10.014
Electron Energy-Loss Spectroscopy in the Electron Microscope
R.F. Egerton Electron Energy-Loss Spectroscopy in the Electron Microscope 29 (2011) https://doi.org/10.1007/978-1-4419-9583-4_2
Exploring different inelastic projection mechanisms for electron tomography
B. Goris, S. Bals, W. Van den Broek, J. Verbeeck and G. Van Tendeloo Ultramicroscopy 111 (8) 1262 (2011) https://doi.org/10.1016/j.ultramic.2011.02.007
Chemical mapping of a block copolymer electrolyte by low-loss EFTEM spectrum-imaging and principal component analysis
F.I. Allen, M. Watanabe, Z. Lee, N.P. Balsara and A.M. Minor Ultramicroscopy 111 (3) 239 (2011) https://doi.org/10.1016/j.ultramic.2010.11.035
Comparison of EFTEM and STEM EELS plasmon imaging of gold nanoparticles in a monochromated TEM
Bernhard Schaffer, Werner Grogger, Gerald Kothleitner and Ferdinand Hofer Ultramicroscopy 110 (8) 1087 (2010) https://doi.org/10.1016/j.ultramic.2009.12.012
Tomographic spectroscopic imaging; an experimental proof of concept
W. Van den Broek, J. Verbeeck, D. Schryvers, S. De Backer and P. Scheunders Ultramicroscopy 109 (4) 296 (2009) https://doi.org/10.1016/j.ultramic.2008.11.022
Electron tomography and holography in materials science
Paul A. Midgley and Rafal E. Dunin-Borkowski Nature Materials 8 (4) 271 (2009) https://doi.org/10.1038/nmat2406
Principle and Applications of EELS Spectroscopy in Material Characterizations
Sang-Won Yoon, Kyou-Hyun Kim, Jae-Pyoung Ahn and Jong-Ku Park Journal of Korean Powder Metallurgy Institute 14 (3) 157 (2007) https://doi.org/10.4150/KPMI.2007.14.3.157
Superlow friction of ta-C lubricated by glycerol: An electron energy loss spectroscopy study
L. Joly-Pottuz, C. Matta, M. I. de Barros Bouchet, B. Vacher, J. M. Martin and T. Sagawa Journal of Applied Physics 102 (6) (2007) https://doi.org/10.1063/1.2779256
Nanocharacterisation
M. Weyland and P. A. Midgley Nanocharacterisation 184 (2007) https://doi.org/10.1039/9781847557926-00184
Acquisition of the EELS data cube by tomographic reconstruction
W. Van den Broek, J. Verbeeck, S. De Backer, P. Scheunders and D. Schryvers Ultramicroscopy 106 (4-5) 269 (2006) https://doi.org/10.1016/j.ultramic.2005.09.001
EFTEM spectrum imaging at high-energy resolution
Bernhard Schaffer, Gerald Kothleitner and Werner Grogger Ultramicroscopy 106 (11-12) 1129 (2006) https://doi.org/10.1016/j.ultramic.2006.04.028
Handbook of Microscopy for Nanotechnology
Christian Colliex and Odile StÈphan Handbook of Microscopy for Nanotechnology 653 (2005) https://doi.org/10.1007/1-4020-8006-9_21
ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY
Wilfried Sigle Annual Review of Materials Research 35 (1) 239 (2005) https://doi.org/10.1146/annurev.matsci.35.102303.091623
Energy-filtered transmission electron microscopy: an overview
J. Verbeeck, D. Van Dyck and G. Van Tendeloo Spectrochimica Acta Part B: Atomic Spectroscopy 59 (10-11) 1529 (2004) https://doi.org/10.1016/j.sab.2004.03.020
Advances in Imaging and Electron Physics
W. Mark Rainforth Advances in Imaging and Electron Physics 132 167 (2004) https://doi.org/10.1016/S1076-5670(04)32004-5
Automated spatial drift correction for EFTEM image series
Bernhard Schaffer, Werner Grogger and Gerald Kothleitner Ultramicroscopy 102 (1) 27 (2004) https://doi.org/10.1016/j.ultramic.2004.08.003
Electron energy-loss spectroscopic profiling of thin film structures: 0.39nm line resolution and 0.04eV precision measurement of near-edge structure shifts at interfaces
T. Walther Ultramicroscopy 96 (3-4) 401 (2003) https://doi.org/10.1016/S0304-3991(03)00104-9
Plasmon energy mapping in energy-filtering transmission electron microscopy
W. Sigle, S. Krämer, V. Varshney, et al. Ultramicroscopy 96 (3-4) 565 (2003) https://doi.org/10.1016/S0304-3991(03)00117-7
New techniques in electron energy-loss spectroscopy and energy-filtered imaging
R.F. Egerton Micron 34 (3-5) 127 (2003) https://doi.org/10.1016/S0968-4328(03)00023-4
Electron Microscopy of Nanotubes
T. Stöckli Electron Microscopy of Nanotubes 121 (2003) https://doi.org/10.1007/978-1-4615-0315-6_5
Subcellular localization of boron in cultured melanoma cells by electron energy‐loss spectroscopy of freeze‐dried cryosections
J. Michel, W. Sauerwein, A. Wittig, G. Balossier and K. Zierold Journal of Microscopy 210 (1) 25 (2003) https://doi.org/10.1046/j.1365-2818.2003.01172.x
Elemental occurrence maps: a starting point for quantitative EELS spectrum image processing
Gerald Kothleitner and Ferdinand Hofer Ultramicroscopy 96 (3-4) 491 (2003) https://doi.org/10.1016/S0304-3991(03)00111-6
Tribological behaviour and chemical characterisation of Si-free and Si-containing carbon nitride coatings
C Fernández-Ramos, J.C Sánchez-López, M Belin, et al. Diamond and Related Materials 11 (2) 169 (2002) https://doi.org/10.1016/S0925-9635(01)00650-1
SrTiO3(100)/(LaMnO3)m(SrMnO3)nlayered heterostructures: A combined EELS and TEM study
J. Verbeeck, O. I. Lebedev, G. Van Tendeloo and B. Mercey Physical Review B 66 (18) (2002) https://doi.org/10.1103/PhysRevB.66.184426
Diffusion of oxygen in CdSe-photosensor arrays
U. Klement, F. Ernst, B. Baretzky and J.M. Plitzko Materials Science and Engineering: B 94 (2-3) 123 (2002) https://doi.org/10.1016/S0921-5107(01)00899-6
Elemental maps from EFTEM images using two different background subtraction models
C. Quintana, J.P. Lechaire, N. Bonnet, C. Risco and J.L. Carrascosa Microscopy Research and Technique 53 (2) 147 (2001) https://doi.org/10.1002/jemt.1079
Four-Dimensional Dielectric Property Imaging of Low-K Materials for Copper Metallization Using Electron Spectroscopic Imaging Series
SC Lo, F-R Chen, JJ Kai, L Chang, Peijun Ding, Barry Chin and Fusen Chen Microscopy and Microanalysis 7 (S2) 1154 (2001) https://doi.org/10.1017/S1431927600031846
Image-spectroscopy – I. The advantages of increased spectral information for compositional EFTEM analysis
P.J Thomas and P.A Midgley Ultramicroscopy 88 (3) 179 (2001) https://doi.org/10.1016/S0304-3991(01)00077-8
Compositional Mapping with Energy Filtering TEM: The Present Status
Ferdinand Hofer, Gerald Kothleitner and Peter Warbichler Microscopy and Microanalysis 7 (S2) 1136 (2001) https://doi.org/10.1017/S1431927600031755
Difference Spectrum Images: Numerical Filters Applied to EELS 3D Data Sets
G Kothleitner, F Hofer and C Trevor Microscopy and Microanalysis 7 (S2) 1160 (2001) https://doi.org/10.1017/S1431927600031871
Prospects and Limitations of Energy Filtering TEM in Spectrum Imaging Analysis
J Mayer, M Pidun, P Karduck, A Zern and K Hahn Microscopy and Microanalysis 6 (S2) 1054 (2000) https://doi.org/10.1017/S1431927600037764
Study of the tribologically transformed structure created during fretting tests
E Sauger, L Ponsonnet, J.M Martin and L Vincent Tribology International 33 (11) 743 (2000) https://doi.org/10.1016/S0301-679X(00)00088-8
A Study of Sulphur Diffusion in ZnMgSSe/ZnSe Quantum Wells by Energy-Loss Imaging in a Transmission Electron Microscope
T. Walther, H. Kalisch, K. Heime, et al. physica status solidi (a) 180 (1) 351 (2000) https://doi.org/10.1002/1521-396X(200007)180:1<351::AID-PSSA351>3.0.CO;2-2
Tribologically transformed structure in fretting
E Sauger, S Fouvry, L Ponsonnet, et al. Wear 245 (1-2) 39 (2000) https://doi.org/10.1016/S0043-1648(00)00464-6
Quantitative Analysis Of Bological Specimens by Spectrum-Imaging in the Energy Filtering Transmission Electron Microscope
RD Leapman, CM Brooks, NW Rizzo and TL Talbot Microscopy and Microanalysis 6 (S2) 160 (2000) https://doi.org/10.1017/S1431927600033298
Mapping the Subcellular Distribution of Calcium in Depolarized Neurons by Electron Energy Loss Spectrum Imaging
SB Andrews, J Hongpaisan, NB Pivovarova, DD Friel and RD Leapman Microscopy and Microanalysis 6 (S2) 162 (2000) https://doi.org/10.1017/S1431927600033304
Quantitative thin film analysis by energy filtering transmission electron microscopy
J.M Plitzko and J Mayer Ultramicroscopy 78 (1-4) 207 (1999) https://doi.org/10.1016/S0304-3991(99)00021-2
Electron Spectroscopic Imaging and Diffraction: Ideal Tools for the Characterization of Ceramic Materials
J Mayer, J Plitzko, J Marien, S Krämer and T Gemming Microscopy and Microanalysis 5 (S2) 788 (1999) https://doi.org/10.1017/S1431927600017268
Comparison of STEM EELS Spectrum Imaging vs EFTEM Spectrum Imaging
J.A. Hunt, G. Kothleitner and R. Harmon Microscopy and Microanalysis 5 (S2) 616 (1999) https://doi.org/10.1017/S1431927600016408
High resolution chemical mapping in the energy-filtering TEM: application to interface layers in ceramics
L Ponsonnet, B Vacher and J.M Martin Thin Solid Films 324 (1-2) 170 (1998) https://doi.org/10.1016/S0040-6090(98)00361-7
Interdisciplinary Development of Eels Compositional Mapping
RD Leapman Microscopy and Microanalysis 4 (S2) 122 (1998) https://doi.org/10.1017/S1431927600020730
EFTEM and STEM EELS Spectrum Imaging
J. A. Hunt and R. H. Harmon Microscopy and Microanalysis 4 (S2) 152 (1998) https://doi.org/10.1017/S1431927600020882
Adhesion‐related glycocalyx study: quantitative approach with imaging‐spectrum in the energy filtering transmission electron microscope (EFTEM)
Mireille Soler, Sophie Desplat-Jego, Béatrice Vacher, Laurence Ponsonnet, Marc Fraterno, Pierre Bongrand, Jean-Michel Martin and Colette Foa FEBS Letters 429 (1) 89 (1998) https://doi.org/10.1016/S0014-5793(98)00570-5
2 (1997) https://doi.org/10.1002/9783527614561.ch1
Use of a mass-thickness marker to estimate systematic errors and statistical noise in the detection of phosphorus by electron spectroscopic imaging
K Richter, A Haking, H Troester, et al. Micron 28 (5) 407 (1997) https://doi.org/10.1016/S0968-4328(97)00049-8
425 (1996) https://doi.org/10.1002/9783527620647.ch16
425 (1996) https://doi.org/10.1002/9783527619283.ch16a
Comparison of Techniques for EELS Mapping in Biology
R.D. Leapman and S.B. Andrews Proceedings, annual meeting, Electron Microscopy Society of America 54 300 (1996) https://doi.org/10.1017/S0424820100163964
Chemical bond mapping of carbon by image-spectrum EELS in the second derivative mode
Jean Michel Martin, Béatrice Vacher, Laurence Ponsonnet and Vincent Dupuis Ultramicroscopy 65 (3-4) 229 (1996) https://doi.org/10.1016/S0304-3991(96)00071-X
Principles of Electron Optics
Principles of Electron Optics 1775 (1996) https://doi.org/10.1016/B978-012333340-7/50264-7
Preliminary investigation of two methods for the automatic handling of multivariate maps in microanalysis
Noël Bonnet Ultramicroscopy 57 (1) 17 (1995) https://doi.org/10.1016/0304-3991(94)00163-H
Interactive Image-Spectrum EELS: Application to Elemental Mapping of Lubricant Colloids
Jean-Michel Martin, Jean-Louis Lavergne, Béatrice Vacher and Kyioshi Inoue Microscopy Microanalysis Microstructures 6 (1) 53 (1995) https://doi.org/10.1051/mmm:1995107
PEELS compositional profiling and mapping at nanometer spatial resolution
Marcel Tencé, Marc Quartuccio and Christian Colliex Ultramicroscopy 58 (1) 42 (1995) https://doi.org/10.1016/0304-3991(94)00177-O
Principles of Electron Optics
Principles of Electron Optics 1775 (1994) https://doi.org/10.1016/B978-0-12-333354-4.50031-8
Electron energy loss spectrometry mapping
Christian Colliex, Marcel Tenc�, Elisabeth Lef�vre, et al. Mikrochimica Acta 114-115 (1) 71 (1994) https://doi.org/10.1007/BF01244534
Iodine insertion in high-Tc cuprates Raman, magnetization, X-ray photoelectron and electron energy loss measurements
Eric Faulques, Phillipe Molinié, Paul Berdahl, Thien Phap Nguyen and Jean-Louis Mansot Physica C: Superconductivity 219 (3-4) 297 (1994) https://doi.org/10.1016/0921-4534(94)90382-4
Application of recording and processing of energy‐filtered image sequences for the elemental mapping of biological specimens: Imaging‐Spectrum
J.‐L. LAVERGNE, C. FOA, P. BONGRAND, D. SEUX and J.‐M. MARTIN Journal of Microscopy 174 (3) 195 (1994) https://doi.org/10.1111/j.1365-2818.1994.tb03467.x