Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

S.T.E.M. chemical submicron scale investigations by EELS in the field of materials science

Marie-Claude Cheynet, Soizic Blais, Cyril Barioz, Dominique Duly

Microsc. Microanal. Microstruct., 5 2 (1994) 91-103

DOI: https://doi.org/10.1051/mmm:019940050209100

This article has been cited by the following article(s):

Chemical analysis of nanometric dielectric layers using spatially resolved VEELS

S. Pokrant, M. Cheynet, S. Jullian and R. Pantel
Ultramicroscopy 104 (3-4) 233 (2005)
https://doi.org/10.1016/j.ultramic.2005.05.001

Structural and chemical analysis of a model Si–SiO2interface using spatially resolved electron-energy-loss spectroscopy

M. C. Cheynet and T. Epicier
Philosophical Magazine 84 (17) 1753 (2004)
https://doi.org/10.1080/14786430310001659507