Articles citing this article

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Cited article:

Particulate characterization by PIXE multivariate spectral analysis

Arlyn J. Antolak, Daniel H. Morse, Patrick G. Grant, et al.
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 261 (1-2) 470 (2007)
https://doi.org/10.1016/j.nimb.2007.04.286

Multivariate statistical analysis for x-ray photoelectron spectroscopy spectral imaging: Effect of image acquisition time

D. E. Peebles, J. A. Ohlhausen, P. G. Kotula, S. Hutton and C. Blomfield
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 22 (4) 1579 (2004)
https://doi.org/10.1116/1.1765134

Application of the scatter diagram technique to the scanning electron microscope: Preliminary results from diamond

J. M. Patat, J. Cazaux, P. Lehuede and O. Durand
Scanning 24 (3) 109 (2002)
https://doi.org/10.1002/sca.4950240301

Use of near Edge X-Ray Absorption Fine Structure Spectromicroscopy to Characterize Multicomponent Polymeric Systems

A. P. Smith, S. G. Urquhart, D. A. Winesett, G. Mitchell and H. Ade
Applied Spectroscopy 55 (12) 1676 (2001)
https://doi.org/10.1366/0003702011954008

Surface Analysis:  X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy

Noel H. Turner and John A. Schreifels
Analytical Chemistry 70 (12) 229 (1998)
https://doi.org/10.1021/a19800139

Design considerations and performance of a combined scanning tunneling and scanning electron microscope

A. Wiessner, J. Kirschner, G. Schäfer and Th. Berghaus
Review of Scientific Instruments 68 (10) 3790 (1997)
https://doi.org/10.1063/1.1148028