Articles citing this article

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Cited article:

Foucault imaging of superconducting fluxons

T. Yoshida, J. Endo, K. Harada, H. Kasai, T. Matsuda, O. Kamimura, A. Tonomura, M. Beleggia, R. Patti and G. Pozzi
Journal of Applied Physics 85 (8) 4096 (1999)
https://doi.org/10.1063/1.370317

Measurement of London penetration depth from holographic images of superconducting vortices: The influence of specimen thickness

J. Bonevich, D. Capacci, K. Harada, et al.
Physical Review B 57 (2) 1200 (1998)
https://doi.org/10.1103/PhysRevB.57.1200

Theoretical Foucault Images of Superconducting Fluxons

M Beleggia, G Pozzi, K Harada, H Kasai, T Matsuda, T Yoshida and A Tonomura
Microscopy and Microanalysis 3 (S2) 509 (1997)
https://doi.org/10.1017/S1431927600009430

Transmission electron holography of silicon nanospheres with surface oxide layers

Y. C. Wang, T. M. Chou, M. Libera and T. F. Kelly
Applied Physics Letters 70 (10) 1296 (1997)
https://doi.org/10.1063/1.118556

Experiments on Foucault Imaging of Superconducting Fluxons

T Yoshida, J Endo, K Harada, H Kasai, T Matsuda, M Beleggia, G Pozzi and A Tonomura
Microscopy and Microanalysis 3 (S2) 507 (1997)
https://doi.org/10.1017/S1431927600009429

On the influence of specimen thickness in TEM images of super-conducting vortices

J. Bonevich, D. Capacci, G. Pozzi, et al.
Proceedings, annual meeting, Electron Microscopy Society of America 54 724 (1996)
https://doi.org/10.1017/S0424820100166087