Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Depth Profiles of Al/Mn/Si Multilayers

Chrystel Hombourger, Philippe Jonnard, Christiane Bonnelle, Eric Beauprez, Marc Spirckel, Béatrice Feltz, Dominique Boutard, Jean-Paul Gallien

Microsc. Microanal. Microstruct., 8 4-5 (1997) 287-300

DOI: https://doi.org/10.1051/mmm:1997122

This article has been cited by the following article(s):

Depth profiling of P shallow implants in silicon by electron-induced X-ray emission spectroscopy

Ch. Hombourger, Ph. Jonnard, Ch. Bonnelle and P.-F. Staub
The European Physical Journal Applied Physics 24 (2) 115 (2003)
https://doi.org/10.1051/epjap:2003078

Thickness determination of very thin SiO2 films on Si by electron-induced x-ray emission spectroscopy

C. Hombourger, P. Jonnard, E. O. Filatova and V. Lukyanov
Applied Physics Letters 81 (15) 2740 (2002)
https://doi.org/10.1063/1.1511281