Articles citing this article

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Cited article:

S.T.M. studies on semiconductor surfaces and metal-semiconductor interfaces

Frank Palmino, Philippe Dumas, Frank Thibaudau, Philippe Mathiez, Christian Mouttet, Frank Salvan

Microsc. Microanal. Microstruct., 1 5-6 (1990) 463-470

DOI: https://doi.org/10.1051/mmm:0199000105-6046300

This article has been cited by the following article(s):

Optical Properties of Low Dimensional Silicon Structures

Ph. Dumas, M. Gu, C. Syrykh, et al.
Optical Properties of Low Dimensional Silicon Structures 157 (1993)
https://doi.org/10.1007/978-94-011-2092-0_18

Low-energy scanning cathodoluminescence spectroscopy and microscopy of porous silicon layers

M. Gu, C. Syrykh, A. Halimaoui, Ph. Dumas and F. Salvan
Journal of Luminescence 57 (1-6) 315 (1993)
https://doi.org/10.1016/0022-2313(93)90149-H