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All issues Microsc. Microanal. Microstruct., 2 2-3 (1991) 301-314 Article references

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Determination of effective ionization cross-sections for quantitative surface chemical microanalysis using REELS

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Electron reflection, diffraction and imaging of bulk crystal surfaces in TEM and STEM

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In-situ formation of MgO2 thin films on MgO single-crystal surfaces at high temperatures

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Electron Microscopy

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