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Cited article:
Christian Colliex
Microsc. Microanal. Microstruct., 2 2-3 (1991) 403-411
This article has been cited by the following article(s):
13 articles
Capturing the signature of single atoms with the tiny probe of a STEM
C. Colliex, A. Gloter, K. March, et al. Ultramicroscopy 123 80 (2012) https://doi.org/10.1016/j.ultramic.2012.04.003
Comparison of the Local Order in Highly Oriented Pyrolitic Graphite and Bundles of Single-Wall Carbon Nanotubes by Nanoscale Extended Energy Loss Spectra
P. Castrucci, F. Tombolini, M. Scarselli, et al. The Journal of Physical Chemistry C 113 (12) 4848 (2009) https://doi.org/10.1021/jp810936c
2 (1997) https://doi.org/10.1002/9783527614561.ch1
425 (1996) https://doi.org/10.1002/9783527620647.ch16
Characterization of III - V semiconductor interfaces byZ-contrast imaging, EELS and CBED
Hubert Lakner, Bernd Bollig, Stefan Ungerechts and Erich Kubalek Journal of Physics D: Applied Physics 29 (7) 1767 (1996) https://doi.org/10.1088/0022-3727/29/7/012
425 (1996) https://doi.org/10.1002/9783527619283.ch16a
Core Level Spectroscopies for Magnetic Phenomena
Christian Colliex NATO ASI Series, Core Level Spectroscopies for Magnetic Phenomena 345 213 (1995) https://doi.org/10.1007/978-1-4757-9871-5_13
Detection limits in elemental distribution images produced by energy filtering TEM: case study of grain boundaries in Si3N4
A. Berger, J. Mayer and H. Kohl Ultramicroscopy 55 (1) 101 (1994) https://doi.org/10.1016/0304-3991(94)90084-1
Electron energy loss spectrometry mapping
Christian Colliex, Marcel Tenc�, Elisabeth Lef�vre, et al. Mikrochimica Acta 114-115 (1) 71 (1994) https://doi.org/10.1007/BF01244534
Energy-filtering Transmission Electron Microscopy in materials and life science
L. Reimer Proceedings, annual meeting, Electron Microscopy Society of America 52 936 (1994) https://doi.org/10.1017/S0424820100172413
Analytical transmission electron microscopy in the nanometer-region
A. R�der and H.-D. Bauer Fresenius' Journal of Analytical Chemistry 349 (1-3) 122 (1994) https://doi.org/10.1007/BF00323235
Growth of Oxide Layers on Thin Aluminum Nitride Samples Measured by Electron Energy‐Loss Spectroscopy
Martin Sternitzke Journal of the American Ceramic Society 76 (9) 2289 (1993) https://doi.org/10.1111/j.1151-2916.1993.tb07766.x
EELS detection limits
J. A. Hunt and D. B. Williams Proceedings, annual meeting, Electron Microscopy Society of America 50 (2) 1468 (1992) https://doi.org/10.1017/S0424820100131978