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Characterization of III - V semiconductor interfaces byZ-contrast imaging, EELS and CBED

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EELS detection limits

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Comparison of the Local Order in Highly Oriented Pyrolitic Graphite and Bundles of Single-Wall Carbon Nanotubes by Nanoscale Extended Energy Loss Spectra

P. Castrucci, F. Tombolini, M. Scarselli, C. Scilletta, M. De Crescenzi, M. Diociaiuti, S. Casciardi, F. Rosei and M. A. El Khakani
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Energy-filtering Transmission Electron Microscopy in materials and life science

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