Free Access
Microsc. Microanal. Microstruct.
Volume 2, Number 2-3, April / June 1991
Page(s) 403 - 411
Microsc. Microanal. Microstruct. 2, 403-411 (1991)
DOI: 10.1051/mmm:0199100202-3040300

The impact of EELS in materials science

Christian Colliex

Laboratoire de Physique des Solides, Université Paris-Sud, Bâtiment 510,91405 Orsay Cedex, France

This summary paper emphasizes the highlights of the workshop which are particularly relevant for applications in materials science. It reviews progress in EELS instrumentation, data recording and processing, and in the use and interpretation of EELS fine structures. We point out the possibilities of EELS as a local analytical tool, discuss EELS detection limits, and indicate potential fields of applications for EELS fine structure studies.

0781 - Electron and ion spectrometers.
2930 - Spectrometers and spectroscopic techniques.
8280 - Chemical analysis and related physical methods of analysis.

Key words
EEL spectroscopy -- Materials science -- Data recording -- Data processing -- Fine structure -- Detection limit -- Microanalysis

© EDP Sciences 1991