Free Access
Issue |
Microsc. Microanal. Microstruct.
Volume 2, Number 2-3, April / June 1991
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Page(s) | 403 - 411 | |
DOI | https://doi.org/10.1051/mmm:0199100202-3040300 |
Microsc. Microanal. Microstruct. 2, 403-411 (1991)
DOI: 10.1051/mmm:0199100202-3040300
Laboratoire de Physique des Solides, Université Paris-Sud, Bâtiment 510,91405 Orsay Cedex, France
0781 - Electron and ion spectrometers.
2930 - Spectrometers and spectroscopic techniques.
8280 - Chemical analysis and related physical methods of analysis.
Key words
EEL spectroscopy -- Materials science -- Data recording -- Data processing -- Fine structure -- Detection limit -- Microanalysis
© EDP Sciences 1991
DOI: 10.1051/mmm:0199100202-3040300
The impact of EELS in materials science
Christian ColliexLaboratoire de Physique des Solides, Université Paris-Sud, Bâtiment 510,91405 Orsay Cedex, France
Abstract
This summary paper emphasizes the highlights of the workshop which are particularly relevant for applications in materials science. It reviews progress in EELS instrumentation, data recording and processing, and in the use and interpretation of EELS fine structures. We point out the possibilities of EELS as a local analytical tool, discuss EELS detection limits, and indicate potential fields of applications for EELS fine structure studies.
0781 - Electron and ion spectrometers.
2930 - Spectrometers and spectroscopic techniques.
8280 - Chemical analysis and related physical methods of analysis.
Key words
EEL spectroscopy -- Materials science -- Data recording -- Data processing -- Fine structure -- Detection limit -- Microanalysis
© EDP Sciences 1991