Articles citing this article

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Cited article:

CBED strain measurements in boron implanted silicon

Roberto Balboni, Stefano Frabboni

Microsc. Microanal. Microstruct., 2 6 (1991) 617-626

DOI: https://doi.org/10.1051/mmm:0199100206061700

This article has been cited by the following article(s):

Determination of bulk mismatch values in trasmission electron microscopy cross-sections of heteostructures by convergent-beam electron diffraction

R. Balboni, S. Frabboni and A. Armigliato
Philosophical Magazine A 77 (1) 67 (1998)
https://doi.org/10.1080/01418619808214231