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Cited article:
Bruno W. Schueler
Microsc. Microanal. Microstruct., 3 2-3 (1992) 119-139
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Metastable decay of molecular fragment ions sputtered from hydrocarbon polymers under keV ion bombardment
A Delcorte and P Bertrand
International Journal of Mass Spectrometry 184 (2-3) 217 (1999)
DOI: 10.1016/S1387-3806(99)00012-3
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Reference Module in Chemistry, Molecular Sciences and Chemical Engineering
N.T.N. Phan, J.S. Fletcher and A.G. Ewing
Reference Module in Chemistry, Molecular Sciences and Chemical Engineering (2014)
DOI: 10.1016/B978-0-12-409547-2.11022-4
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A new plasma-based method to promote cell adhesion on micrometric tracks on polystyrene substrates
J.-B. Lhoest, E. Detrait, J.-L. Dewez, P. Van Den Bosch De Aguilar and P. Bertrand
Journal of Biomaterials Science, Polymer Edition 7 (12) 1039 (1996)
DOI: 10.1163/156856296X00534
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Surface characterization by time-of-flight SIMS of a catalyst for oxygen electroreduction: pyrolyzed cobalt phthalocyanine-on-carbon black
L.T. Weng, P. Bertrand, G. Lalande, D. Guay and J.P. Dodelet
Applied Surface Science 84 (1) 9 (1995)
DOI: 10.1016/0169-4332(94)00470-6
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Scanning ion images; analysis of pharmaceutical drugs at organelle levels
E. Larras-Regard and M.-C. Mony
International Journal of Mass Spectrometry and Ion Processes 143 147 (1995)
DOI: 10.1016/0168-1176(94)04133-R
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Polymer metallization: Low energy ion beam surface modification to improve adhesion
P Bertrand, P Lambert and Y Travaly
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 131 (1-4) 71 (1997)
DOI: 10.1016/S0168-583X(97)00149-3
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Modern Methods for Analysing Archaeological and Historical Glass
Christoph Kleber and Manfred Schreiner
Modern Methods for Analysing Archaeological and Historical Glass 247 (2013)
DOI: 10.1002/9781118314234.ch11
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Influence of the substrate on the ion yield in direct laser desorption–ionization for thin organic layers
M. Benazouz, B. Hakim and J.L. Debrun
International Journal of Mass Spectrometry 177 (2-3) 217 (1998)
DOI: 10.1016/S1387-3806(98)14070-8
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On the role of molecular photofragmentation during depth profiling of tantalum oxide layers by laser SNMS
A. Wucher, K. Franzreb, H.-J. Mathieu and D. Landolt
Surface and Interface Analysis 23 (12) 844 (1995)
DOI: 10.1002/sia.740231207
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Anchoring of Ru–Pt and Ru–Au Clusters onto a Phosphane‐Functionalized Carbon Support
Christopher Willocq, Deborah Vidick, Bernard Tinant, Arnaud Delcorte, Patrick Bertrand, Michel Devillers and Sophie Hermans
European Journal of Inorganic Chemistry 2011 (30) 4721 (2011)
DOI: 10.1002/ejic.201100384
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Secondary molecular ion emission from aliphatic polymers bombarded with low energy ions: Effects of the molecular structure and the ion beam induced surface degradation
A. Delcorte, L.T. Weng and P. Bertrand
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 100 (2-3) 213 (1995)
DOI: 10.1016/0168-583X(94)00842-6
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Ullmann's Encyclopedia of Industrial Chemistry
John C. Rivière, Laszlo Fabry, Siegfried Pahlke, et al.
Ullmann's Encyclopedia of Industrial Chemistry (2011)
DOI: 10.1002/14356007.o25_o09
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Kinetic energy distributions of secondary molecular ions from thin organic films under ion bombardment
A. Delcorte and P. Bertrand
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 115 (1-4) 246 (1996)
DOI: 10.1016/0168-583X(95)01563-9
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Fast sensors for time-of-flight imaging applications
Claire Vallance, Mark Brouard, Alexandra Lauer, et al.
Phys. Chem. Chem. Phys. 16 (2) 383 (2014)
DOI: 10.1039/C3CP53183J
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Handbook of Surface and Interface Analysis
Birgit Hagenhoff, Reinhard Kersting and Derk Rading
Handbook of Surface and Interface Analysis 65 (2009)
DOI: 10.1201/9781420007800-c4
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Influence of the primary ion beam parameters (nature, energy, and angle) on the kinetic energy distribution of molecular fragments sputtered from poly(ethylene terephthalate) by kiloelectron volt ions
A Delcorte, X Vanden Eynde, P Bertrand and D.F Reich
International Journal of Mass Spectrometry 189 (2-3) 133 (1999)
DOI: 10.1016/S1387-3806(99)00063-9
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Chemical Structure Analyses of Organic Materials Using TOF-SIMS Equipped with MS/MS
Shin-ichi IIDA, Gregory L. FISHER, John S. HAMMOND, Scott R. BRYAN and Takuya MIYAYAMA
Hyomen Kagaku 37 (8) 354 (2016)
DOI: 10.1380/jsssj.37.354
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Round robin of time-of-flight secondary ion mass spectrometry damage studies of a photoimmobilized reagent on diamond surfaces designed for surface glycoengineering
D Léonard, B Keller, Y Chevolot, M Wieland and H.J Mathieu
Applied Surface Science 144-145 409 (1999)
DOI: 10.1016/S0169-4332(98)00833-2
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Static secondary ion mass spectrometry (SSIMS) of biological compounds in tissue and tissue-like matrices
C.M. John and R.W. Odom
International Journal of Mass Spectrometry and Ion Processes 161 (1-3) 47 (1997)
DOI: 10.1016/S0168-1176(96)04505-3
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Microelastic properties of minimally adhesive surfaces: A comparative study of RTV11™ and Intersleek elastomers™
Fernando Terán Arce, Recep Avci, Iwona B. Beech, Keith E. Cooksey and Barbara Wigglesworth-Cooksey
The Journal of Chemical Physics 119 (3) 1671 (2003)
DOI: 10.1063/1.1582435
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ToF-SIMS study of alternate polyelectrolyte thin films: Chemical surface characterization and molecular secondary ions sampling depth
A Delcorte, P Bertrand, X Arys, et al.
Surface Science 366 (1) 149 (1996)
DOI: 10.1016/0039-6028(96)00779-0
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Energy distributions of hydrocarbon secondary ions from thin organic films under keV ion bombardment: Correlation between kinetic and formation energy of ions sputtered from tricosenoic acid
A. Delcorte and P. Bertrand
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 117 (3) 235 (1996)
DOI: 10.1016/0168-583X(96)00306-0
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An in-vacuum, pixelated detection system for mass spectrometric analysis and imaging of macromolecules
Julia H. Jungmann, Donald F. Smith, Andras Kiss, et al.
International Journal of Mass Spectrometry 341-342 34 (2013)
DOI: 10.1016/j.ijms.2013.02.010
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Desorption/ionization of molecular nanoclusters: SIMS versus MALDI
A. Delcorte, S. Hermans, M. Devillers, et al.
Applied Surface Science 231-232 131 (2004)
DOI: 10.1016/j.apsusc.2004.03.092
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Using MESIMS to analyze polymer MALDI matrix solubility
Scott D. Hanton and Kevin G. Owens
Journal of the American Society for Mass Spectrometry 16 (7) 1172 (2005)
DOI: 10.1016/j.jasms.2005.03.013
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Autoradiography, MALDI-MS, and SIMS-MS Imaging in Pharmaceutical Discovery and Development
Eric G. Solon, Alain Schweitzer, Markus Stoeckli and Brendan Prideaux
The AAPS Journal 12 (1) 11 (2010)
DOI: 10.1208/s12248-009-9158-4
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Fibronectin adsorption, conformation, and orientation on polystyrene substrates studied by radiolabeling, XPS, and ToF SIMS
J.-B. Lhoest, E. Detrait, P. van den Bosch de Aguilar and P. Bertrand
Journal of Biomedical Materials Research 41 (1) 95 (1998)
DOI: 10.1002/(SICI)1097-4636(199807)41:1<95::AID-JBM12>3.0.CO;2-G
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Static secondary ion mass spectrometry (S-SIMS) Part 1: methodology and structural interpretation
Luc Van Vaeck, Annemie Adriaens and Renaat Gijbels
Mass Spectrometry Reviews 18 (1) 1 (1999)
DOI: 10.1002/(SICI)1098-2787(1999)18:1<1::AID-MAS1>3.0.CO;2-W
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Enhancement of the static SIMS secondary ion yields of lipid moieties by ultrathin gold coating of aged oil paint surfaces
K. Keune and J. J. Boon
Surface and Interface Analysis 36 (13) 1620 (2004)
DOI: 10.1002/sia.1996
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Reactive ion sputter depth profiling of tantalum oxides: A comparative study using ToF-SIMS and laser-SNMS
K. Franzreb, H. J. Mathieu and D. Landolt
Surface and Interface Analysis 23 (9) 641 (1995)
DOI: 10.1002/sia.740230910
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Static SIMS investigation of metal/polymer interfaces
Y. Travaly and P. Bertrand
Surface and Interface Analysis 23 (5) 328 (1995)
DOI: 10.1002/sia.740230509
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Part 1.N-(m-(3-(trifluoromethyl)diazirine-3-yl)phenyl)-4-maleimido-butyramide (MAD) on silicon, silicon nitride and diamond
D. L�onard, Y. Chevolot, O. Bucher, H. Sigrist and H. J. Mathieu
Surface and Interface Analysis 26 (11) 783 (1998)
DOI: 10.1002/(SICI)1096-9918(199810)26:11<783::AID-SIA420>3.0.CO;2-O
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Characterization of titanium hydride films covered by nanoscale evaporated Au layers: ToF-SIMS, XPS and AES depth profile analysis
W. Lisowski, A. H. J. van den Berg, D. Leonard and H. J. Mathieu
Surface and Interface Analysis 29 (4) 292 (2000)
DOI: 10.1002/(SICI)1096-9918(200004)29:4<292::AID-SIA863>3.0.CO;2-L
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XPS and ToF-SIMS study of freeze-dried and thermally cured melamine-formaldehyde resins of different molar ratios
G�raldine Coullerez, Didier L�onard, Stefan Lundmark and Hans J�rg Mathieu
Surface and Interface Analysis 29 (7) 431 (2000)
DOI: 10.1002/1096-9918(200007)29:7<431::AID-SIA886>3.0.CO;2-1
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Development of novel projection-type imaging mass spectrometer
J. Aoki and M. Toyoda
Review of Scientific Instruments 92 (5) 053706 (2021)
DOI: 10.1063/5.0037370
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Time-of-flight secondary ion mass spectrometry (ToF-SIMS) study of SF6and SF6-CF4plasma-treated low-density polyethylene films
D. Léonard, P. Bertrand, Y. Khairallah-Abdelnour, F. Arefi-Khonsari and J. Amouroux
Surface and Interface Analysis 23 (7-8) 467 (1995)
DOI: 10.1002/sia.740230706
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High Dynamic Range Bio-Molecular Ion Microscopy with the Timepix Detector
Julia H. Jungmann, Luke MacAleese, Jan Visser, Marc J. J. Vrakking and Ron M. A. Heeren
Analytical Chemistry 83 (20) 7888 (2011)
DOI: 10.1021/ac2017629
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Investigations of electrospray sample deposition for polymer MALDI mass spectrometry
Scott D. Hanton, Ingrid Z. Hyder, James R. Stets, Kevin G. Owens, William R. Blair, Charles M. Guttman and Anthony A. Giuseppetti
Journal of the American Society for Mass Spectrometry 15 (2) 168 (2004)
DOI: 10.1016/j.jasms.2003.09.012
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Characterization of Nanoparticles
Kaija Schaepe, Harald Jungnickel, Thomas Heinrich, et al.
Characterization of Nanoparticles 481 (2020)
DOI: 10.1016/B978-0-12-814182-3.00025-0
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Subcellular imaging mass spectrometry of brain tissue
Liam A. McDonnell, Sander R. Piersma, A. F. Maarten Altelaar, et al.
Journal of Mass Spectrometry 40 (2) 160 (2005)
DOI: 10.1002/jms.735
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Secondary ion mass spectrometry of high-sulfur coal: Observation and interpretation of polysulfur ions
Handong Liang
Chinese Science Bulletin 44 (13) 1242 (1999)
DOI: 10.1007/BF02885975
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Depth profiling of polymer samples using Ga+
and C60
+
ion beams
N. Nieuwjaer, C. Poleunis, A. Delcorte and P. Bertrand
Surface and Interface Analysis 41 (1) 6 (2009)
DOI: 10.1002/sia.2931
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A review of current applications of mass spectrometry for neuroproteomics in epilepsy
Xinyu Liu, Fuqiang Wen, Jinliang Yang, Lijuan Chen and Yu-Quan Wei
Mass Spectrometry Reviews n/a (2009)
DOI: 10.1002/mas.20243
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Quantitative surface analysis of styrene-butadiene copolymers using time-of-flight secondary ion mass spectrometry
L. T. Weng, P. Bertrand, W. Lauer, R. Zimmer and S. Busetti
Surface and Interface Analysis 23 (13) 879 (1995)
DOI: 10.1002/sia.740231305
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Electron Microscopy
Nicholas P. Lockyer
Methods in Molecular Biology, Electron Microscopy 369 543 (2007)
DOI: 10.1007/978-1-59745-294-6_27
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Static TOF-SIMS — a VAMAS interlaboratory study. Part I. Repeatability and reproducibility of spectra
I. S. Gilmore, M. P. Seah and F. M. Green
Surface and Interface Analysis 37 (8) 651 (2005)
DOI: 10.1002/sia.2061
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Recognition Receptors in Biosensors
Hans Jörg Mathieu
Recognition Receptors in Biosensors 135 (2010)
DOI: 10.1007/978-1-4419-0919-0_3
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TOF–SIMS study of alkanethiol adsorption and ordering on gold
L Houssiau and P Bertrand
Applied Surface Science 175-176 399 (2001)
DOI: 10.1016/S0169-4332(01)00132-5
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Funktionale molekulare dünne Filme: topologische Template für die chemoselektive Bindung antigener Peptide an selbstorganisierte Monoschichten
Lukas Scheibler, Pascal Dumy, Mila Boncheva, et al.
Angewandte Chemie 111 (5) 699 (1999)
DOI: 10.1002/(SICI)1521-3757(19990301)111:5<699::AID-ANGE699>3.0.CO;2-C
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The Composition of Poly(Ethylene Terephthalate) (PET) Surface Precipitates Determined at High Resolving Power by Tandem Mass Spectrometry Imaging
Gregory L. Fisher, John S. Hammond, Scott R. Bryan, Paul E. Larson and Ron M. A. Heeren
Microscopy and Microanalysis 23 (4) 843 (2017)
DOI: 10.1017/S1431927617000654
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Imaging of peptides in the rat brain using MALDI-FTICR mass spectrometry
Ioana M. Taban, A. F. Maarten Altelaar, Yuri E. M. van der Burgt, Liam A. McDonnell, Ron M. A. Heeren, Jens Fuchser and Gökhan Baykut
Journal of the American Society for Mass Spectrometry 18 (1) 145 (2007)
DOI: 10.1016/j.jasms.2006.09.017
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Microscope imaging mass spectrometry with a reflectron
Robert J. Burleigh, Ang Guo, Natasha Smith, et al.
Review of Scientific Instruments 91 (2) 023306 (2020)
DOI: 10.1063/1.5142271
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Materials Characterization
Materials Characterization 739 (2019)
DOI: 10.31399/asm.hb.v10.a0006683
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Bioimaging of elements and small molecules using MS
Nicholas P Lockyer
Bioanalysis 3 (10) 1047 (2011)
DOI: 10.4155/bio.11.55
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Application of lipidomics in bivalve aquaculture, a review
Vincenzo A. Laudicella, Phillip D. Whitfield, Stefano Carboni, Mary K. Doherty and Adam D. Hughes
Reviews in Aquaculture 12 (2) 678 (2020)
DOI: 10.1111/raq.12346
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Imaging Secondary Ion Mass Spectrometry of a Paint Cross Section Taken from an Early Netherlandish Painting by Rogier van der Weyden
Katrien Keune and Jaap J. Boon
Analytical Chemistry 76 (5) 1374 (2004)
DOI: 10.1021/ac035201a
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Understanding Gold−Thiolate Cluster Emission from Self-assembled Monolayers upon Kiloelectronvolt Ion Bombardment
B. Arezki, A. Delcorte, B. J. Garrison and P. Bertrand
The Journal of Physical Chemistry B 110 (13) 6832 (2006)
DOI: 10.1021/jp058252f
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Sample Metallization for Performance Improvement in Desorption/Ionization of Kilodalton Molecules: Quantitative Evaluation, Imaging Secondary Ion MS, and Laser Ablation
A. Delcorte, J. Bour, F. Aubriet, J.-F. Muller and P. Bertrand
Analytical Chemistry 75 (24) 6875 (2003)
DOI: 10.1021/ac0302105
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Multitechnique Investigation of the Physisorption and Thermal Treatment of Mixed-Metal Clusters on Carbon
Christopher Willocq, Arnaud Delcorte, Sophie Hermans, Patrick Bertrand and Michel Devillers
The Journal of Physical Chemistry B 109 (19) 9482 (2005)
DOI: 10.1021/jp050560q
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Surface and Depth Profiling Investigation of a Drug-Loaded Copolymer Utilized To Coat Taxus Express2 Stents
Robert M. Braun, Juan Cheng, Edward E. Parsonage, Jeff Moeller and Nicholas Winograd
Analytical Chemistry 78 (24) 8347 (2006)
DOI: 10.1021/ac0615089
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High-Spatial Resolution Mass Spectrometric Imaging of Peptide and Protein Distributions on a Surface
Stefan L. Luxembourg, Todd H. Mize, Liam A. McDonnell and Ron M. A. Heeren
Analytical Chemistry 76 (18) 5339 (2004)
DOI: 10.1021/ac049692q
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Organic Secondary Ion Mass Spectrometry: Sensitivity Enhancement by Gold Deposition
A. Delcorte, N. Médard and P. Bertrand
Analytical Chemistry 74 (19) 4955 (2002)
DOI: 10.1021/ac020125h
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Generation of Ternary Pr−Mo−O Oxides by Solid State Reactions between Oxide Powders under Ultrasonic Stirring
Frédéric De Smet, Michel Devillers, Etienne Ferain, Claude Poleunis and Patrick Bertrand
Chemistry of Materials 11 (2) 324 (1999)
DOI: 10.1021/cm980551c
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Matrix-Enhanced Secondary Ion Mass Spectrometry: A Method for Molecular Analysis of Solid Surfaces
Kuang Jen Wu and Robert W. Odom
Analytical Chemistry 68 (5) 873 (1996)
DOI: 10.1021/ac950717i
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Bulk and Surface Quantification of a Biodegradable and -medical Copolyester
F.-R. Lang, D. Léonard, H. J. Mathieu, E. M. Moser and P. Bertrand
Macromolecules 31 (18) 6177 (1998)
DOI: 10.1021/ma980059e
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Using Matrix Peaks To Map Topography: Increased Mass Resolution and Enhanced Sensitivity in Chemical Imaging
Liam A. McDonnell, Todd H. Mize, Stefan L. Luxembourg, Sander Koster, Gert B. Eijkel, Elisabeth Verpoorte, Nico F. de Rooij and Ron M. A. Heeren
Analytical Chemistry 75 (17) 4373 (2003)
DOI: 10.1021/ac034401j
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Imaging with Mass Spectrometry
M. L. Pacholski and N. Winograd
Chemical Reviews 99 (10) 2977 (1999)
DOI: 10.1021/cr980137w
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Collision Cascade and Sputtering Process in a Polymer
A. Delcorte, P. Bertrand and B. J. Garrison
The Journal of Physical Chemistry B 105 (39) 9474 (2001)
DOI: 10.1021/jp011099e
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Characterization of Interlayer Cs+ in Clay Samples Using Secondary Ion Mass Spectrometry with Laser Sample Modification
G. S. Groenewold, R. Avci, C. Karahan, K. Lefebre, R. V. Fox, M. M. Cortez, A. K. Gianotto, J. Sunner and W. L. Manner
Analytical Chemistry 76 (10) 2893 (2004)
DOI: 10.1021/ac035400u
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Surface Characterization of a Biochip Prototype for Cell-Based Biosensor Applications
S. A. Makohliso, D. Léonard, L. Giovangrandi, H. J. Mathieu, M. Ilegems and P. Aebischer
Langmuir 15 (8) 2940 (1999)
DOI: 10.1021/la980688h
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Adsorption of Polyelectrolyte Multilayers on Polymer Surfaces
A. Delcorte, P. Bertrand, E. Wischerhoff and A. Laschewsky
Langmuir 13 (19) 5125 (1997)
DOI: 10.1021/la970105o
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C60+ Secondary Ion Microscopy Using a Delay Line Detector
Leendert A. Klerk, Nicholas P. Lockyer, Andriy Kharchenko, Luke MacAleese, Patricia Y. W. Dankers, John C. Vickerman and Ron M. A. Heeren
Analytical Chemistry 82 (3) 801 (2010)
DOI: 10.1021/ac902587g
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Gold-Enhanced Biomolecular Surface Imaging of Cells and Tissue by SIMS and MALDI Mass Spectrometry
A. F. Maarten Altelaar, Ivo Klinkert, Kees Jalink, Robert P. J. de Lange, Roger A. H. Adan, Ron M. A. Heeren and Sander R. Piersma
Analytical Chemistry 78 (3) 734 (2006)
DOI: 10.1021/ac0513111
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Perfluoropolyethers: Analysis by TOF-SIMS
A. M. Spool and Paul H. Kasai
Macromolecules 29 (5) 1691 (1996)
DOI: 10.1021/ma951341d
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“Matrix” Effects in ToF-SIMS Analyses of Styrene−Methyl Methacrylate Random Copolymers
X. Vanden Eynde, P. Bertrand and J. Penelle
Macromolecules 33 (15) 5624 (2000)
DOI: 10.1021/ma991960c
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Molecular Weight Dependent Fragmentation of Selectively Deuterated Polystyrenes in ToF−SIMS
X. Vanden Eynde, K. Reihs and P. Bertrand
Macromolecules 32 (9) 2925 (1999)
DOI: 10.1021/ma981558i
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Bismuth adducted intact molecular ions [M + Bi]+ under low-energy bismuth cluster ion beams
Takuya Miyayama and Shin-ichi Iida
Journal of Vacuum Science & Technology B 38 (3) 032804 (2020)
DOI: 10.1116/6.0000096
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Wider vision capability provided by a curved surface sample holder for TOF-SIMS imaging
Shin-ichi Iida, Hsun-Yun Chang, Gregory L. Fisher, Takuya Miyayama and Ibuki Tanaka
Journal of Vacuum Science & Technology B 38 (3) 034013 (2020)
DOI: 10.1116/6.0000039
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P.K. Chu
742 (1995)
DOI: 10.1109/ICSICT.1995.503546
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Influence of End Group and Molecular Weight on Polybutadiene Fingerprint Secondary Ion Mass Spectra
X. Vanden Eynde, P. Bertrand, P. Dubois and R. Jérôme
Macromolecules 31 (19) 6409 (1998)
DOI: 10.1021/ma9807062
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Enhanced TOF-SIMS Imaging of a Micropatterned Protein by Stable Isotope Protein Labeling
Anna M. Belu, Zhongping Yang, Ryan Aslami and Ashutosh Chilkoti
Analytical Chemistry 73 (2) 143 (2001)
DOI: 10.1021/ac000771l
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Desorption of Emulsifiers from Polystyrene Latexes Studied by Various Surface Techniques: A Comparison between XPS, ISS, and Static SIMS
L. T. Weng, P. Bertrand, J. H. Stone-Masui and W. E. E. Stone
Langmuir 13 (11) 2943 (1997)
DOI: 10.1021/la962078s
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Molecular Imaging of a Micropatterned Biological Ligand on an Activated Polymer Surface
Zhongping Yang, Anna M. Belu, Andrea Liebmann-Vinson, Harry Sugg and Ashutosh Chilkoti
Langmuir 16 (19) 7482 (2000)
DOI: 10.1021/la0000623
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Metal-Assisted Secondary Ion Mass Spectrometry Using Atomic (Ga+, In+) and Fullerene Projectiles
A. Delcorte, S. Yunus, N. Wehbe, N. Nieuwjaer, C. Poleunis, A. Felten, L. Houssiau, J.-J. Pireaux and P. Bertrand
Analytical Chemistry 79 (10) 3673 (2007)
DOI: 10.1021/ac062406l
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Study of the mechanism of direct laser desorption/ionisation for some small organic molecules (M < 400 Daltons)
M. Benazouz, B. Hakim, J. L. Debrun, D. Strivay and G. Weber
Rapid Communications in Mass Spectrometry 13 (23) 2302 (1999)
DOI: 10.1002/(SICI)1097-0231(19991215)13:23<2302::AID-RCM789>3.0.CO;2-#
See this article
Infrared Mass Spectrometric Imaging below the Diffraction Limit
Stefan L. Luxembourg, Liam A. McDonnell, Todd H. Mize and Ron M. A. Heeren
Journal of Proteome Research 4 (3) 671 (2005)
DOI: 10.1021/pr049762+
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TOF-SIMS Characterization and Imaging of Controlled-Release Drug Delivery Systems
Anna M. Belu, Martyn C. Davies, J. Mike Newton and Nikin Patel
Analytical Chemistry 72 (22) 5625 (2000)
DOI: 10.1021/ac000450+
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Partially Fluorinated Maleimide Copolymers for Langmuir Films of Improved Stability. 2. Spreading Behavior and Multilayer Formation
Peter Hendlinger, André Laschewsky, Patrick Bertrand, Arnaud Delcorte, Roger Legras, Bernard Nysten and Dietmar Möbius
Langmuir 13 (2) 310 (1997)
DOI: 10.1021/la960639+
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Combined Use of Atomic Force Microscopy, X-ray Photoelectron Spectroscopy, and Secondary Ion Mass Spectrometry for Cell Surface Analysis
Etienne Dague, Arnaud Delcorte, Jean-Paul Latgé and Yves F. Dufrêne
Langmuir 24 (7) 2955 (2008)
DOI: 10.1021/la703741y
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Effect of Local Matrix Crystal Variations in Matrix-Assisted Ionization Techniques for Mass Spectrometry
Stefan L. Luxembourg, Liam A. McDonnell, Marc C. Duursma, Xinghua Guo and Ron M. A. Heeren
Analytical Chemistry 75 (10) 2333 (2003)
DOI: 10.1021/ac026434p
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Metal Salts for Molecular Ion Yield Enhancement in Organic Secondary Ion Mass Spectrometry: A Critical Assessment
A. Delcorte and P. Bertrand
Analytical Chemistry 77 (7) 2107 (2005)
DOI: 10.1021/ac040158s
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Analysis of Opioid and Amyloid Peptides Using Time-of-Flight Secondary Ion Mass Spectrometry
Santiago Solé-Domènech, Björn Johansson, Martin Schalling, Jakob Malm and Peter Sjövall
Analytical Chemistry 82 (5) 1964 (2010)
DOI: 10.1021/ac902712f
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Ion Microscope Imaging Mass Spectrometry Using a Timepix3-Based Optical Camera
Daniel Wood, Robert J. Burleigh, Natasha Smith, Daniela Bortoletto, Mark Brouard, Michael Burt, Andrei Nomerotski, Richard Plackett and Ian Shipsey
Journal of the American Society for Mass Spectrometry 33 (12) 2328 (2022)
DOI: 10.1021/jasms.2c00223
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Time‐of‐flight secondary ion mass spectrometric analysis of polymer surfaces: A review
Ananthu Prasad, Nisa V. Salim, Miran Mozetič, Lekshmi Kailas and Sabu Thomas
Journal of Applied Polymer Science 139 (23) 52286 (2022)
DOI: 10.1002/app.52286
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