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Recep Avci, Anna M. Hagenston, Nancy L. Equall, et al.
Surface and Interface Analysis 27 (8) 789 (1999)
DOI: 10.1002/(SICI)1096-9918(199908)27:8<789::AID-SIA574>3.0.CO;2-D
See this article

Spreading and adhesion of ASA on hydrophilic and hydrophobic SiO2

J. Lindfors, S. Ylisuvanto, T. Kallio, J. Laine and P. Stenius
Colloids and Surfaces A: Physicochemical and Engineering Aspects 256 (2-3) 217 (2005)
DOI: 10.1016/j.colsurfa.2005.01.028
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Analysis of surface particles by time-of-flight secondary ion mass spectrometry

P.K. Chu, R.W. Odom and D.F. Reich
Materials Chemistry and Physics 43 (2) 87 (1996)
DOI: 10.1016/0254-0584(96)01606-9
See this article

A microscopic view of organic sample sputtering

A. Delcorte, P. Bertrand and B.J. Garrison
Applied Surface Science 203-204 166 (2003)
DOI: 10.1016/S0169-4332(02)00724-9
See this article

Metastable decay of molecular fragment ions sputtered from hydrocarbon polymers under keV ion bombardment

A Delcorte and P Bertrand
International Journal of Mass Spectrometry 184 (2-3) 217 (1999)
DOI: 10.1016/S1387-3806(99)00012-3
See this article

Reference Module in Chemistry, Molecular Sciences and Chemical Engineering

N.T.N. Phan, J.S. Fletcher and A.G. Ewing
Reference Module in Chemistry, Molecular Sciences and Chemical Engineering (2014)
DOI: 10.1016/B978-0-12-409547-2.11022-4
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A new plasma-based method to promote cell adhesion on micrometric tracks on polystyrene substrates

J.-B. Lhoest, E. Detrait, J.-L. Dewez, P. Van Den Bosch De Aguilar and P. Bertrand
Journal of Biomaterials Science, Polymer Edition 7 (12) 1039 (1996)
DOI: 10.1163/156856296X00534
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Surface characterization by time-of-flight SIMS of a catalyst for oxygen electroreduction: pyrolyzed cobalt phthalocyanine-on-carbon black

L.T. Weng, P. Bertrand, G. Lalande, D. Guay and J.P. Dodelet
Applied Surface Science 84 (1) 9 (1995)
DOI: 10.1016/0169-4332(94)00470-6
See this article

Adhesion study of SiOx / PET films: comparison between scratch test and fragmentation test

Y. Pitton, S.D. Hamm, F.-R. Lang, et al.
Journal of Adhesion Science and Technology 10 (10) 1047 (1996)
DOI: 10.1163/156856196X00094
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Scanning ion images; analysis of pharmaceutical drugs at organelle levels

E. Larras-Regard and M.-C. Mony
International Journal of Mass Spectrometry and Ion Processes 143 147 (1995)
DOI: 10.1016/0168-1176(94)04133-R
See this article

Polymer metallization: Low energy ion beam surface modification to improve adhesion

P Bertrand, P Lambert and Y Travaly
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 131 (1-4) 71 (1997)
DOI: 10.1016/S0168-583X(97)00149-3
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Modern Methods for Analysing Archaeological and Historical Glass

Christoph Kleber and Manfred Schreiner
Modern Methods for Analysing Archaeological and Historical Glass 247 (2013)
DOI: 10.1002/9781118314234.ch11
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Influence of the substrate on the ion yield in direct laser desorption–ionization for thin organic layers

M. Benazouz, B. Hakim and J.L. Debrun
International Journal of Mass Spectrometry 177 (2-3) 217 (1998)
DOI: 10.1016/S1387-3806(98)14070-8
See this article

Handbook of Surface and Interface Analysis

Birgit Hagenhoff, Reinhard Kersting and Derk Rading
Handbook of Surface and Interface Analysis 65 (2009)
DOI: 10.1201/9781420007800-c4
See this article

On the role of molecular photofragmentation during depth profiling of tantalum oxide layers by laser SNMS

A. Wucher, K. Franzreb, H.-J. Mathieu and D. Landolt
Surface and Interface Analysis 23 (12) 844 (1995)
DOI: 10.1002/sia.740231207
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Anchoring of Ru–Pt and Ru–Au Clusters onto a Phosphane‐Functionalized Carbon Support

Christopher Willocq, Deborah Vidick, Bernard Tinant, Arnaud Delcorte, Patrick Bertrand, Michel Devillers and Sophie Hermans
European Journal of Inorganic Chemistry 2011 (30) 4721 (2011)
DOI: 10.1002/ejic.201100384
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Secondary molecular ion emission from aliphatic polymers bombarded with low energy ions: Effects of the molecular structure and the ion beam induced surface degradation

A. Delcorte, L.T. Weng and P. Bertrand
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 100 (2-3) 213 (1995)
DOI: 10.1016/0168-583X(94)00842-6
See this article

Ullmann's Encyclopedia of Industrial Chemistry

John C. Rivière, Laszlo Fabry, Siegfried Pahlke, et al.
Ullmann's Encyclopedia of Industrial Chemistry (2011)
DOI: 10.1002/14356007.o25_o09
See this article

Kinetic energy distributions of secondary molecular ions from thin organic films under ion bombardment

A. Delcorte and P. Bertrand
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 115 (1-4) 246 (1996)
DOI: 10.1016/0168-583X(95)01563-9
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Fast sensors for time-of-flight imaging applications

Claire Vallance, Mark Brouard, Alexandra Lauer, et al.
Phys. Chem. Chem. Phys. 16 (2) 383 (2014)
DOI: 10.1039/C3CP53183J
See this article

Influence of the primary ion beam parameters (nature, energy, and angle) on the kinetic energy distribution of molecular fragments sputtered from poly(ethylene terephthalate) by kiloelectron volt ions

A Delcorte, X Vanden Eynde, P Bertrand and D.F Reich
International Journal of Mass Spectrometry 189 (2-3) 133 (1999)
DOI: 10.1016/S1387-3806(99)00063-9
See this article

Chemical Structure Analyses of Organic Materials Using TOF-SIMS Equipped with MS/MS

Shin-ichi IIDA, Gregory L. FISHER, John S. HAMMOND, Scott R. BRYAN and Takuya MIYAYAMA
Hyomen Kagaku 37 (8) 354 (2016)
DOI: 10.1380/jsssj.37.354
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Round robin of time-of-flight secondary ion mass spectrometry damage studies of a photoimmobilized reagent on diamond surfaces designed for surface glycoengineering

D Léonard, B Keller, Y Chevolot, M Wieland and H.J Mathieu
Applied Surface Science 144-145 409 (1999)
DOI: 10.1016/S0169-4332(98)00833-2
See this article

Static secondary ion mass spectrometry (SSIMS) of biological compounds in tissue and tissue-like matrices

C.M. John and R.W. Odom
International Journal of Mass Spectrometry and Ion Processes 161 (1-3) 47 (1997)
DOI: 10.1016/S0168-1176(96)04505-3
See this article

Microelastic properties of minimally adhesive surfaces: A comparative study of RTV11™ and Intersleek elastomers™

Fernando Terán Arce, Recep Avci, Iwona B. Beech, Keith E. Cooksey and Barbara Wigglesworth-Cooksey
The Journal of Chemical Physics 119 (3) 1671 (2003)
DOI: 10.1063/1.1582435
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ToF-SIMS study of alternate polyelectrolyte thin films: Chemical surface characterization and molecular secondary ions sampling depth

A Delcorte, P Bertrand, X Arys, et al.
Surface Science 366 (1) 149 (1996)
DOI: 10.1016/0039-6028(96)00779-0
See this article

Energy distributions of hydrocarbon secondary ions from thin organic films under keV ion bombardment: Correlation between kinetic and formation energy of ions sputtered from tricosenoic acid

A. Delcorte and P. Bertrand
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 117 (3) 235 (1996)
DOI: 10.1016/0168-583X(96)00306-0
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An in-vacuum, pixelated detection system for mass spectrometric analysis and imaging of macromolecules

Julia H. Jungmann, Donald F. Smith, Andras Kiss, et al.
International Journal of Mass Spectrometry 341-342 34 (2013)
DOI: 10.1016/j.ijms.2013.02.010
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Desorption/ionization of molecular nanoclusters: SIMS versus MALDI

A. Delcorte, S. Hermans, M. Devillers, et al.
Applied Surface Science 231-232 131 (2004)
DOI: 10.1016/j.apsusc.2004.03.092
See this article

Using MESIMS to analyze polymer MALDI matrix solubility

Scott D. Hanton and Kevin G. Owens
Journal of the American Society for Mass Spectrometry 16 (7) 1172 (2005)
DOI: 10.1016/j.jasms.2005.03.013
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Autoradiography, MALDI-MS, and SIMS-MS Imaging in Pharmaceutical Discovery and Development

Eric G. Solon, Alain Schweitzer, Markus Stoeckli and Brendan Prideaux
The AAPS Journal 12 (1) 11 (2010)
DOI: 10.1208/s12248-009-9158-4
See this article

Fibronectin adsorption, conformation, and orientation on polystyrene substrates studied by radiolabeling, XPS, and ToF SIMS

J.-B. Lhoest, E. Detrait, P. van den Bosch de Aguilar and P. Bertrand
Journal of Biomedical Materials Research 41 (1) 95 (1998)
DOI: 10.1002/(SICI)1097-4636(199807)41:1<95::AID-JBM12>3.0.CO;2-G
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Static secondary ion mass spectrometry (S-SIMS) Part 1: methodology and structural interpretation

Luc Van Vaeck, Annemie Adriaens and Renaat Gijbels
Mass Spectrometry Reviews 18 (1) 1 (1999)
DOI: 10.1002/(SICI)1098-2787(1999)18:1<1::AID-MAS1>3.0.CO;2-W
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Enhancement of the static SIMS secondary ion yields of lipid moieties by ultrathin gold coating of aged oil paint surfaces

K. Keune and J. J. Boon
Surface and Interface Analysis 36 (13) 1620 (2004)
DOI: 10.1002/sia.1996
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Reactive ion sputter depth profiling of tantalum oxides: A comparative study using ToF-SIMS and laser-SNMS

K. Franzreb, H. J. Mathieu and D. Landolt
Surface and Interface Analysis 23 (9) 641 (1995)
DOI: 10.1002/sia.740230910
See this article

Static SIMS investigation of metal/polymer interfaces

Y. Travaly and P. Bertrand
Surface and Interface Analysis 23 (5) 328 (1995)
DOI: 10.1002/sia.740230509
See this article

Part 1.N-(m-(3-(trifluoromethyl)diazirine-3-yl)phenyl)-4-maleimido-butyramide (MAD) on silicon, silicon nitride and diamond

D. L�onard, Y. Chevolot, O. Bucher, H. Sigrist and H. J. Mathieu
Surface and Interface Analysis 26 (11) 783 (1998)
DOI: 10.1002/(SICI)1096-9918(199810)26:11<783::AID-SIA420>3.0.CO;2-O
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Characterization of titanium hydride films covered by nanoscale evaporated Au layers: ToF-SIMS, XPS and AES depth profile analysis

W. Lisowski, A. H. J. van den Berg, D. Leonard and H. J. Mathieu
Surface and Interface Analysis 29 (4) 292 (2000)
DOI: 10.1002/(SICI)1096-9918(200004)29:4<292::AID-SIA863>3.0.CO;2-L
See this article

XPS and ToF-SIMS study of freeze-dried and thermally cured melamine-formaldehyde resins of different molar ratios

G�raldine Coullerez, Didier L�onard, Stefan Lundmark and Hans J�rg Mathieu
Surface and Interface Analysis 29 (7) 431 (2000)
DOI: 10.1002/1096-9918(200007)29:7<431::AID-SIA886>3.0.CO;2-1
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Development of novel projection-type imaging mass spectrometer

J. Aoki and M. Toyoda
Review of Scientific Instruments 92 (5) 053706 (2021)
DOI: 10.1063/5.0037370
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Time-of-flight secondary ion mass spectrometry (ToF-SIMS) study of SF6and SF6-CF4plasma-treated low-density polyethylene films

D. Léonard, P. Bertrand, Y. Khairallah-Abdelnour, F. Arefi-Khonsari and J. Amouroux
Surface and Interface Analysis 23 (7-8) 467 (1995)
DOI: 10.1002/sia.740230706
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High Dynamic Range Bio-Molecular Ion Microscopy with the Timepix Detector

Julia H. Jungmann, Luke MacAleese, Jan Visser, Marc J. J. Vrakking and Ron M. A. Heeren
Analytical Chemistry 83 (20) 7888 (2011)
DOI: 10.1021/ac2017629
See this article

Investigations of electrospray sample deposition for polymer MALDI mass spectrometry

Scott D. Hanton, Ingrid Z. Hyder, James R. Stets, Kevin G. Owens, William R. Blair, Charles M. Guttman and Anthony A. Giuseppetti
Journal of the American Society for Mass Spectrometry 15 (2) 168 (2004)
DOI: 10.1016/j.jasms.2003.09.012
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Characterization of Nanoparticles

Kaija Schaepe, Harald Jungnickel, Thomas Heinrich, et al.
Characterization of Nanoparticles 481 (2020)
DOI: 10.1016/B978-0-12-814182-3.00025-0
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Subcellular imaging mass spectrometry of brain tissue

Liam A. McDonnell, Sander R. Piersma, A. F. Maarten Altelaar, et al.
Journal of Mass Spectrometry 40 (2) 160 (2005)
DOI: 10.1002/jms.735
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Secondary ion mass spectrometry of high-sulfur coal: Observation and interpretation of polysulfur ions

Handong Liang
Chinese Science Bulletin 44 (13) 1242 (1999)
DOI: 10.1007/BF02885975
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Depth profiling of polymer samples using Ga+ and C60 + ion beams

N. Nieuwjaer, C. Poleunis, A. Delcorte and P. Bertrand
Surface and Interface Analysis 41 (1) 6 (2009)
DOI: 10.1002/sia.2931
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A review of current applications of mass spectrometry for neuroproteomics in epilepsy

Xinyu Liu, Fuqiang Wen, Jinliang Yang, Lijuan Chen and Yu-Quan Wei
Mass Spectrometry Reviews n/a (2009)
DOI: 10.1002/mas.20243
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Quantitative surface analysis of styrene-butadiene copolymers using time-of-flight secondary ion mass spectrometry

L. T. Weng, P. Bertrand, W. Lauer, R. Zimmer and S. Busetti
Surface and Interface Analysis 23 (13) 879 (1995)
DOI: 10.1002/sia.740231305
See this article

Electron Microscopy

Nicholas P. Lockyer
Methods in Molecular Biology, Electron Microscopy 369 543 (2007)
DOI: 10.1007/978-1-59745-294-6_27
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Static TOF-SIMS — a VAMAS interlaboratory study. Part I. Repeatability and reproducibility of spectra

I. S. Gilmore, M. P. Seah and F. M. Green
Surface and Interface Analysis 37 (8) 651 (2005)
DOI: 10.1002/sia.2061
See this article

Recognition Receptors in Biosensors

Hans Jörg Mathieu
Recognition Receptors in Biosensors 135 (2010)
DOI: 10.1007/978-1-4419-0919-0_3
See this article

TOF–SIMS study of alkanethiol adsorption and ordering on gold

L Houssiau and P Bertrand
Applied Surface Science 175-176 399 (2001)
DOI: 10.1016/S0169-4332(01)00132-5
See this article

Funktionale molekulare dünne Filme: topologische Template für die chemoselektive Bindung antigener Peptide an selbstorganisierte Monoschichten

Lukas Scheibler, Pascal Dumy, Mila Boncheva, et al.
Angewandte Chemie 111 (5) 699 (1999)
DOI: 10.1002/(SICI)1521-3757(19990301)111:5<699::AID-ANGE699>3.0.CO;2-C
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The Composition of Poly(Ethylene Terephthalate) (PET) Surface Precipitates Determined at High Resolving Power by Tandem Mass Spectrometry Imaging

Gregory L. Fisher, John S. Hammond, Scott R. Bryan, Paul E. Larson and Ron M. A. Heeren
Microscopy and Microanalysis 23 (4) 843 (2017)
DOI: 10.1017/S1431927617000654
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Imaging of peptides in the rat brain using MALDI-FTICR mass spectrometry

Ioana M. Taban, A. F. Maarten Altelaar, Yuri E. M. van der Burgt, Liam A. McDonnell, Ron M. A. Heeren, Jens Fuchser and Gökhan Baykut
Journal of the American Society for Mass Spectrometry 18 (1) 145 (2007)
DOI: 10.1016/j.jasms.2006.09.017
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Materials Characterization

Materials Characterization 739 (2019)
DOI: 10.31399/asm.hb.v10.a0006683
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Microscope imaging mass spectrometry with a reflectron

Robert J. Burleigh, Ang Guo, Natasha Smith, et al.
Review of Scientific Instruments 91 (2) 023306 (2020)
DOI: 10.1063/1.5142271
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Bioimaging of elements and small molecules using MS

Nicholas P Lockyer
Bioanalysis 3 (10) 1047 (2011)
DOI: 10.4155/bio.11.55
See this article

Application of lipidomics in bivalve aquaculture, a review

Vincenzo A. Laudicella, Phillip D. Whitfield, Stefano Carboni, Mary K. Doherty and Adam D. Hughes
Reviews in Aquaculture 12 (2) 678 (2020)
DOI: 10.1111/raq.12346
See this article

Imaging Secondary Ion Mass Spectrometry of a Paint Cross Section Taken from an Early Netherlandish Painting by Rogier van der Weyden

Katrien Keune and Jaap J. Boon
Analytical Chemistry 76 (5) 1374 (2004)
DOI: 10.1021/ac035201a
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Understanding Gold−Thiolate Cluster Emission from Self-assembled Monolayers upon Kiloelectronvolt Ion Bombardment

B. Arezki, A. Delcorte, B. J. Garrison and P. Bertrand
The Journal of Physical Chemistry B 110 (13) 6832 (2006)
DOI: 10.1021/jp058252f
See this article

Sample Metallization for Performance Improvement in Desorption/Ionization of Kilodalton Molecules:  Quantitative Evaluation, Imaging Secondary Ion MS, and Laser Ablation

A. Delcorte, J. Bour, F. Aubriet, J.-F. Muller and P. Bertrand
Analytical Chemistry 75 (24) 6875 (2003)
DOI: 10.1021/ac0302105
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Multitechnique Investigation of the Physisorption and Thermal Treatment of Mixed-Metal Clusters on Carbon

Christopher Willocq, Arnaud Delcorte, Sophie Hermans, Patrick Bertrand and Michel Devillers
The Journal of Physical Chemistry B 109 (19) 9482 (2005)
DOI: 10.1021/jp050560q
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Surface and Depth Profiling Investigation of a Drug-Loaded Copolymer Utilized To Coat Taxus Express2 Stents

Robert M. Braun, Juan Cheng, Edward E. Parsonage, Jeff Moeller and Nicholas Winograd
Analytical Chemistry 78 (24) 8347 (2006)
DOI: 10.1021/ac0615089
See this article

High-Spatial Resolution Mass Spectrometric Imaging of Peptide and Protein Distributions on a Surface

Stefan L. Luxembourg, Todd H. Mize, Liam A. McDonnell and Ron M. A. Heeren
Analytical Chemistry 76 (18) 5339 (2004)
DOI: 10.1021/ac049692q
See this article

Organic Secondary Ion Mass Spectrometry:  Sensitivity Enhancement by Gold Deposition

A. Delcorte, N. Médard and P. Bertrand
Analytical Chemistry 74 (19) 4955 (2002)
DOI: 10.1021/ac020125h
See this article

Generation of Ternary Pr−Mo−O Oxides by Solid State Reactions between Oxide Powders under Ultrasonic Stirring

Frédéric De Smet, Michel Devillers, Etienne Ferain, Claude Poleunis and Patrick Bertrand
Chemistry of Materials 11 (2) 324 (1999)
DOI: 10.1021/cm980551c
See this article

Matrix-Enhanced Secondary Ion Mass Spectrometry:  A Method for Molecular Analysis of Solid Surfaces

Kuang Jen Wu and Robert W. Odom
Analytical Chemistry 68 (5) 873 (1996)
DOI: 10.1021/ac950717i
See this article

Bulk and Surface Quantification of a Biodegradable and -medical Copolyester

F.-R. Lang, D. Léonard, H. J. Mathieu, E. M. Moser and P. Bertrand
Macromolecules 31 (18) 6177 (1998)
DOI: 10.1021/ma980059e
See this article

Using Matrix Peaks To Map Topography:  Increased Mass Resolution and Enhanced Sensitivity in Chemical Imaging

Liam A. McDonnell, Todd H. Mize, Stefan L. Luxembourg, Sander Koster, Gert B. Eijkel, Elisabeth Verpoorte, Nico F. de Rooij and Ron M. A. Heeren
Analytical Chemistry 75 (17) 4373 (2003)
DOI: 10.1021/ac034401j
See this article

Imaging with Mass Spectrometry

M. L. Pacholski and N. Winograd
Chemical Reviews 99 (10) 2977 (1999)
DOI: 10.1021/cr980137w
See this article

Collision Cascade and Sputtering Process in a Polymer

A. Delcorte, P. Bertrand and B. J. Garrison
The Journal of Physical Chemistry B 105 (39) 9474 (2001)
DOI: 10.1021/jp011099e
See this article

Characterization of Interlayer Cs+ in Clay Samples Using Secondary Ion Mass Spectrometry with Laser Sample Modification

G. S. Groenewold, R. Avci, C. Karahan, K. Lefebre, R. V. Fox, M. M. Cortez, A. K. Gianotto, J. Sunner and W. L. Manner
Analytical Chemistry 76 (10) 2893 (2004)
DOI: 10.1021/ac035400u
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Surface Characterization of a Biochip Prototype for Cell-Based Biosensor Applications

S. A. Makohliso, D. Léonard, L. Giovangrandi, H. J. Mathieu, M. Ilegems and P. Aebischer
Langmuir 15 (8) 2940 (1999)
DOI: 10.1021/la980688h
See this article

Adsorption of Polyelectrolyte Multilayers on Polymer Surfaces

A. Delcorte, P. Bertrand, E. Wischerhoff and A. Laschewsky
Langmuir 13 (19) 5125 (1997)
DOI: 10.1021/la970105o
See this article

C60+ Secondary Ion Microscopy Using a Delay Line Detector

Leendert A. Klerk, Nicholas P. Lockyer, Andriy Kharchenko, Luke MacAleese, Patricia Y. W. Dankers, John C. Vickerman and Ron M. A. Heeren
Analytical Chemistry 82 (3) 801 (2010)
DOI: 10.1021/ac902587g
See this article

Gold-Enhanced Biomolecular Surface Imaging of Cells and Tissue by SIMS and MALDI Mass Spectrometry

A. F. Maarten Altelaar, Ivo Klinkert, Kees Jalink, Robert P. J. de Lange, Roger A. H. Adan, Ron M. A. Heeren and Sander R. Piersma
Analytical Chemistry 78 (3) 734 (2006)
DOI: 10.1021/ac0513111
See this article

Perfluoropolyethers:  Analysis by TOF-SIMS

A. M. Spool and Paul H. Kasai
Macromolecules 29 (5) 1691 (1996)
DOI: 10.1021/ma951341d
See this article

“Matrix” Effects in ToF-SIMS Analyses of Styrene−Methyl Methacrylate Random Copolymers

X. Vanden Eynde, P. Bertrand and J. Penelle
Macromolecules 33 (15) 5624 (2000)
DOI: 10.1021/ma991960c
See this article

Metal Salts for Molecular Ion Yield Enhancement in Organic Secondary Ion Mass Spectrometry:  A Critical Assessment

A. Delcorte and P. Bertrand
Analytical Chemistry 77 (7) 2107 (2005)
DOI: 10.1021/ac040158s
See this article

Molecular Weight Dependent Fragmentation of Selectively Deuterated Polystyrenes in ToF−SIMS

X. Vanden Eynde, K. Reihs and P. Bertrand
Macromolecules 32 (9) 2925 (1999)
DOI: 10.1021/ma981558i
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Bismuth adducted intact molecular ions [M + Bi]+ under low-energy bismuth cluster ion beams

Takuya Miyayama and Shin-ichi Iida
Journal of Vacuum Science & Technology B 38 (3) 032804 (2020)
DOI: 10.1116/6.0000096
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Wider vision capability provided by a curved surface sample holder for TOF-SIMS imaging

Shin-ichi Iida, Hsun-Yun Chang, Gregory L. Fisher, Takuya Miyayama and Ibuki Tanaka
Journal of Vacuum Science & Technology B 38 (3) 034013 (2020)
DOI: 10.1116/6.0000039
See this article

Influence of End Group and Molecular Weight on Polybutadiene Fingerprint Secondary Ion Mass Spectra

X. Vanden Eynde, P. Bertrand, P. Dubois and R. Jérôme
Macromolecules 31 (19) 6409 (1998)
DOI: 10.1021/ma9807062
See this article

Enhanced TOF-SIMS Imaging of a Micropatterned Protein by Stable Isotope Protein Labeling

Anna M. Belu, Zhongping Yang, Ryan Aslami and Ashutosh Chilkoti
Analytical Chemistry 73 (2) 143 (2001)
DOI: 10.1021/ac000771l
See this article

Desorption of Emulsifiers from Polystyrene Latexes Studied by Various Surface Techniques:  A Comparison between XPS, ISS, and Static SIMS

L. T. Weng, P. Bertrand, J. H. Stone-Masui and W. E. E. Stone
Langmuir 13 (11) 2943 (1997)
DOI: 10.1021/la962078s
See this article

Molecular Imaging of a Micropatterned Biological Ligand on an Activated Polymer Surface

Zhongping Yang, Anna M. Belu, Andrea Liebmann-Vinson, Harry Sugg and Ashutosh Chilkoti
Langmuir 16 (19) 7482 (2000)
DOI: 10.1021/la0000623
See this article

Metal-Assisted Secondary Ion Mass Spectrometry Using Atomic (Ga+, In+) and Fullerene Projectiles

A. Delcorte, S. Yunus, N. Wehbe, N. Nieuwjaer, C. Poleunis, A. Felten, L. Houssiau, J.-J. Pireaux and P. Bertrand
Analytical Chemistry 79 (10) 3673 (2007)
DOI: 10.1021/ac062406l
See this article