EDP Sciences logo
Search
Menu
All issues Microsc. Microanal. Microstruct., 3 2-3 (1992) 119-139 Article references

Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Secondary ion mass spectrometry

Nicholas P. Lockyer, Satoka Aoyagi, John S. Fletcher, Ian S. Gilmore, Paul A. W. van der Heide, Katie L. Moore, Bonnie J. Tyler and Lu-Tao Weng
Nature Reviews Methods Primers 4 (1) (2024)
https://doi.org/10.1038/s43586-024-00311-9

A Perspective of Multi‐Reflecting TOF MS

A. N. Verenchikov, V. V. Makarov, A. V. Vorobyev and S. N. Kirillov
Mass Spectrometry Reviews (2024)
https://doi.org/10.1002/mas.21915

A Computer Simulation Study on Ion Optics Aiming at the Realization of Projection-Type Mass Spectrometry Imaging

Yasuhide Naito
Qeios 6 (12) (2024)
https://doi.org/10.32388/U7ETB0.2

Secondary ion mass spectrometry for bone research

Christine Kern, Stefanie Kern, Anja Henss and Marcus Rohnke
Biointerphases 18 (4) (2023)
https://doi.org/10.1116/6.0002820

Development of High Throughput Microscope Mode Secondary Ion Mass Spectrometry Imaging

Felicia M. Green, Maria Elena Castellani, Yifeng Jia, et al.
Journal of the American Society for Mass Spectrometry 34 (7) 1272 (2023)
https://doi.org/10.1021/jasms.2c00371

Time‐of‐flight secondary ion mass spectrometric analysis of polymer surfaces: A review

Ananthu Prasad, Nisa V. Salim, Miran Mozetič, Lekshmi Kailas and Sabu Thomas
Journal of Applied Polymer Science 139 (23) (2022)
https://doi.org/10.1002/app.52286

Ion Microscope Imaging Mass Spectrometry Using a Timepix3-Based Optical Camera

Daniel Wood, Robert J. Burleigh, Natasha Smith, et al.
Journal of the American Society for Mass Spectrometry 33 (12) 2328 (2022)
https://doi.org/10.1021/jasms.2c00223

Development of novel projection-type imaging mass spectrometer

J. Aoki and M. Toyoda
Review of Scientific Instruments 92 (5) (2021)
https://doi.org/10.1063/5.0037370

Wider vision capability provided by a curved surface sample holder for TOF-SIMS imaging

Shin-ichi Iida, Hsun-Yun Chang, Gregory L. Fisher, Takuya Miyayama and Ibuki Tanaka
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 38 (3) (2020)
https://doi.org/10.1116/6.0000039

Investigation of Airborne Molecular Contamination in Cleanroom Air Environment through Portable Soft X-Ray Radiolysis Detector

Changhyuk Kim, Kyungil Cho and David Y. H. Pui
Applied Sciences 10 (3) 978 (2020)
https://doi.org/10.3390/app10030978

Bismuth adducted intact molecular ions [M + Bi]+ under low-energy bismuth cluster ion beams

Takuya Miyayama and Shin-ichi Iida
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 38 (3) (2020)
https://doi.org/10.1116/6.0000096

Microscope imaging mass spectrometry with a reflectron

Robert J. Burleigh, Ang Guo, Natasha Smith, et al.
Review of Scientific Instruments 91 (2) (2020)
https://doi.org/10.1063/1.5142271

Application of lipidomics in bivalve aquaculture, a review

Vincenzo A. Laudicella, Phillip D. Whitfield, Stefano Carboni, Mary K. Doherty and Adam D. Hughes
Reviews in Aquaculture 12 (2) 678 (2020)
https://doi.org/10.1111/raq.12346

Mass-resolved ion microscope imaging over expanded mass ranges using double-field post-extraction differential acceleration

Ang Guo, Michael Burt and Mark Brouard
International Journal of Mass Spectrometry 429 121 (2018)
https://doi.org/10.1016/j.ijms.2017.06.010

Combined ToF-SIMS and AFM protocol for accurate 3D chemical analysis and data visualization

Maiglid A. Moreno, Isabelle Mouton, Nicolas Chevalier, et al.
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 36 (3) (2018)
https://doi.org/10.1116/1.5019464

The Composition of Poly(Ethylene Terephthalate) (PET) Surface Precipitates Determined at High Resolving Power by Tandem Mass Spectrometry Imaging

Gregory L. Fisher, John S. Hammond, Scott R. Bryan, Paul E. Larson and Ron M. A. Heeren
Microscopy and Microanalysis 23 (4) 843 (2017)
https://doi.org/10.1017/S1431927617000654

Parallel imaging MS/MS TOF-SIMS instrument

Gregory L. Fisher, John S. Hammond, Paul E. Larson, Scott R. Bryan and Ron M. A. Heeren
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 34 (3) (2016)
https://doi.org/10.1116/1.4943568

Chemical Structure Analyses of Organic Materials Using TOF-SIMS Equipped with MS/MS

Shin-ichi IIDA, Gregory L. FISHER, John S. HAMMOND, Scott R. BRYAN and Takuya MIYAYAMA
Hyomen Kagaku 37 (8) 354 (2016)
https://doi.org/10.1380/jsssj.37.354

A New Method and Mass Spectrometer Design for TOF-SIMS Parallel Imaging MS/MS

Gregory L. Fisher, Anne L. Bruinen, Nina Ogrinc Potočnik, et al.
Analytical Chemistry 88 (12) 6433 (2016)
https://doi.org/10.1021/acs.analchem.6b01022

Real-time and online screening method for materials emitting volatile organic compounds

Changhyuk Kim, Yong Tae Sul and David Y. H. Pui
Journal of Nanoparticle Research 18 (9) (2016)
https://doi.org/10.1007/s11051-016-3598-4

Secondary ion yields for vacuum-type electrospray droplet beams measured with a triple focus time-of-flight analyzer

Satoshi Ninomiya, Yuji Sakai, Ryo Watanabe, et al.
Rapid Communications in Mass Spectrometry 30 (20) 2279 (2016)
https://doi.org/10.1002/rcm.7703

Mass Spectra and Yields of Intact Charged Biomolecules Ejected by Massive Cluster Impact for Bioimaging in a Time-of-Flight Secondary Ion Microscope

Jitao Zhang, Klaus Franzreb, Sergei A. Aksyonov and Peter Williams
Analytical Chemistry 87 (21) 10779 (2015)
https://doi.org/10.1021/acs.analchem.5b01802

Three-Dimensional Image of Cleavage Bodies in Nuclei Is Configured Using Gas Cluster Ion Beam with Time-of-Flight Secondary Ion Mass Spectrometry

Noritaka Masaki, Itsuko Ishizaki, Takahiro Hayasaka, et al.
Scientific Reports 5 (1) (2015)
https://doi.org/10.1038/srep10000

Single cell lipidomics of SKBR‐3 breast cancer cells by using time‐of‐flight secondary‐ion mass spectrometry

Yoshimi Ide, Michihiko Waki, Itsuko Ishizaki, Yasuyuki Nagata, Fumiyoshi Yamazaki, Takahiro Hayasaka, Noritaka Masaki, Koji Ikegami, Takeshi Kondo, Kiyoshi Shibata, Hiroyuki Ogura, Noriaki Sanada and Mitsutoshi Setou
Surface and Interface Analysis 46 (S1) 181 (2014)
https://doi.org/10.1002/sia.5523

Fast sensors for time-of-flight imaging applications

Claire Vallance, Mark Brouard, Alexandra Lauer, et al.
Phys. Chem. Chem. Phys. 16 (2) 383 (2014)
https://doi.org/10.1039/C3CP53183J

Fast sensors for time-of-flight imaging applications

Claire Vallance, Mark Brouard, Alexandra Lauer, Craig S. Slater, Edward Halford, Benjamin Winter, Simon J. King, Jason W. L. Lee, Daniel E. Pooley, Iain Sedgwick, Renato Turchetta, Andrei Nomerotski, Jaya John John and Laura Hill
Phys. Chem. Chem. Phys. 16 (2) 383 (2014)
https://doi.org/10.1039/c3cp53183j

Reference Module in Chemistry, Molecular Sciences and Chemical Engineering

N.T.N. Phan, J.S. Fletcher and A.G. Ewing
Reference Module in Chemistry, Molecular Sciences and Chemical Engineering (2014)
https://doi.org/10.1016/B978-0-12-409547-2.11022-4

Modifications to a commercially available linear mass spectrometer for mass‐resolved microscopy with the pixel imaging mass spectrometry (PImMS) camera

E. Halford, B. Winter, M. D. Mills, S. P. Thompson, V. Parr, J. J. John, A. Nomerotski, C. Vallance, R. Turchetta and M. Brouard
Rapid Communications in Mass Spectrometry 28 (15) 1649 (2014)
https://doi.org/10.1002/rcm.6940

Imaging with biomolecular ions generated by massive cluster impact in a time‐of‐flight secondary ion microscope

Jitao Zhang, Klaus Franzreb and Peter Williams
Rapid Communications in Mass Spectrometry 28 (20) 2211 (2014)
https://doi.org/10.1002/rcm.7006

Cluster TOF‐SIMS imaging as a tool for micrometric histology of lipids in tissue

Claudia Bich, David Touboul and Alain Brunelle
Mass Spectrometry Reviews 33 (6) 442 (2014)
https://doi.org/10.1002/mas.21399

An in-vacuum, pixelated detection system for mass spectrometric analysis and imaging of macromolecules

Julia H. Jungmann, Donald F. Smith, Andras Kiss, et al.
International Journal of Mass Spectrometry 341-342 34 (2013)
https://doi.org/10.1016/j.ijms.2013.02.010

Velocity corrected ion extraction in microscope mode imaging mass spectrometry

B. Winter, E. Halford and M. Brouard
International Journal of Mass Spectrometry 356 14 (2013)
https://doi.org/10.1016/j.ijms.2013.09.012

Characterization of Arsenic Contamination on Rust from Ton Containers

Gary S. Groenewold, Recep Avci, Robert V. Fox, et al.
Industrial & Engineering Chemistry Research 52 (4) 1396 (2013)
https://doi.org/10.1021/ie301937j

Study of experimental variability in TOF-SIMS mass spectrometry imaging of biological samples

Claudia Bich, David Touboul and Alain Brunelle
International Journal of Mass Spectrometry 337 43 (2013)
https://doi.org/10.1016/j.ijms.2012.12.010

Characterization of polymeric films subjected to lithium ion beam irradiation

Gary S. Groenewold, W. Roger Cannon, Paul A. Lessing, et al.
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 296 41 (2013)
https://doi.org/10.1016/j.nimb.2012.11.017

Biological Tissue Imaging with a Position and Time Sensitive Pixelated Detector

Julia H. Jungmann, Donald F. Smith, Luke MacAleese, et al.
Journal of the American Society for Mass Spectrometry 23 (10) 1679 (2012)
https://doi.org/10.1007/s13361-012-0444-5

Ullmann's Encyclopedia of Industrial Chemistry

John C. Rivière, Laszlo Fabry, Siegfried Pahlke, et al.
Ullmann's Encyclopedia of Industrial Chemistry (2011)
https://doi.org/10.1002/14356007.o25_o09

High Dynamic Range Bio-Molecular Ion Microscopy with the Timepix Detector

Julia H. Jungmann, Luke MacAleese, Jan Visser, Marc J. J. Vrakking and Ron M. A. Heeren
Analytical Chemistry 83 (20) 7888 (2011)
https://doi.org/10.1021/ac2017629

Anchoring of Ru–Pt and Ru–Au Clusters onto a Phosphane‐Functionalized Carbon Support

Christopher Willocq, Deborah Vidick, Bernard Tinant, Arnaud Delcorte, Patrick Bertrand, Michel Devillers and Sophie Hermans
European Journal of Inorganic Chemistry 2011 (30) 4721 (2011)
https://doi.org/10.1002/ejic.201100384

Autoradiography, MALDI-MS, and SIMS-MS Imaging in Pharmaceutical Discovery and Development

Eric G. Solon, Alain Schweitzer, Markus Stoeckli and Brendan Prideaux
The AAPS Journal 12 (1) 11 (2010)
https://doi.org/10.1208/s12248-009-9158-4

Analysis of Opioid and Amyloid Peptides Using Time-of-Flight Secondary Ion Mass Spectrometry

Santiago Solé-Domènech, Björn Johansson, Martin Schalling, Jakob Malm and Peter Sjövall
Analytical Chemistry 82 (5) 1964 (2010)
https://doi.org/10.1021/ac902712f

C60+ Secondary Ion Microscopy Using a Delay Line Detector

Leendert A. Klerk, Nicholas P. Lockyer, Andriy Kharchenko, et al.
Analytical Chemistry 82 (3) 801 (2010)
https://doi.org/10.1021/ac902587g

A review of current applications of mass spectrometry for neuroproteomics in epilepsy

Xinyu Liu, Fuqiang Wen, Jinliang Yang, Lijuan Chen and Yu‐Quan Wei
Mass Spectrometry Reviews 29 (2) 197 (2010)
https://doi.org/10.1002/mas.20243

Combined chemical and topographic imaging at atmospheric pressure via microprobe laser desorption/ionization mass spectrometry–atomic force microscopy

James A. Bradshaw, Olga S. Ovchinnikova, Kent A. Meyer and Douglas E. Goeringer
Rapid Communications in Mass Spectrometry 23 (23) 3781 (2009)
https://doi.org/10.1002/rcm.4313

Characterization of bidentate phosphoryl compounds on soil particulates using SIMS

Gary S. Groenewold, Gary L. Gresham, Recep Avci and Muhammedin Deliorman
Surface and Interface Analysis 41 (3) 244 (2009)
https://doi.org/10.1002/sia.3015

Depth profiling of polymer samples using Ga+ and C60+ ion beams

N. Nieuwjaer, C. Poleunis, A. Delcorte and P. Bertrand
Surface and Interface Analysis 41 (1) 6 (2009)
https://doi.org/10.1002/sia.2931

Combined Use of Atomic Force Microscopy, X-ray Photoelectron Spectroscopy, and Secondary Ion Mass Spectrometry for Cell Surface Analysis

Etienne Dague, Arnaud Delcorte, Jean-Paul Latgé and Yves F. Dufrêne
Langmuir 24 (7) 2955 (2008)
https://doi.org/10.1021/la703741y

Ion yield improvement for static secondary ion mass spectrometry by use of polyatomic primary ions

Roel De Mondt, Luc Van Vaeck, Andreas Heile, Heinrich F. Arlinghaus, Nicolas Nieuwjaer, Arnaud Delcorte, Patrick Bertrand, Jens Lenaerts and Frank Vangaever
Rapid Communications in Mass Spectrometry 22 (10) 1481 (2008)
https://doi.org/10.1002/rcm.3533

Metal-Assisted Secondary Ion Mass Spectrometry Using Atomic (Ga+, In+) and Fullerene Projectiles

A. Delcorte, S. Yunus, N. Wehbe, et al.
Analytical Chemistry 79 (10) 3673 (2007)
https://doi.org/10.1021/ac062406l

High-resolution MALDI imaging mass spectrometry allows localization of peptide distributions at cellular length scales in pituitary tissue sections

A.F. Maarten Altelaar, Ioana M. Taban, Liam A. McDonnell, et al.
International Journal of Mass Spectrometry 260 (2-3) 203 (2007)
https://doi.org/10.1016/j.ijms.2006.09.028

Surface analysis of particulates from laboratory hood exhaust manifold

Gary S. Groenewold, Marnie M. Cortez, Anita K. Gianotto, Garold L. Gresham, John E. Olson, Robert V. Fox, Byron M. White, William F. Bauer, Recep Avci, Muhammedin Deliorman and Eric Williams
Surface and Interface Analysis 39 (6) 547 (2007)
https://doi.org/10.1002/sia.2554

Imaging of peptides in the rat brain using MALDI-FTICR mass spectrometry

Ioana M. Taban, A. F. Maarten Altelaar, Yuri E. M. van der Burgt, et al.
Journal of the American Society for Mass Spectrometry 18 (1) 145 (2007)
https://doi.org/10.1016/j.jasms.2006.09.017

Gold-Enhanced Biomolecular Surface Imaging of Cells and Tissue by SIMS and MALDI Mass Spectrometry

A. F. Maarten Altelaar, Ivo Klinkert, Kees Jalink, et al.
Analytical Chemistry 78 (3) 734 (2006)
https://doi.org/10.1021/ac0513111

Depth profiling of taxol-loaded poly(styrene-b-isobutylene-b-styrene) using Ga+ and C60+ ion beams

R.M. Braun, J. Cheng, E.E. Parsonage, J. Moeller and N. Winograd
Applied Surface Science 252 (19) 6615 (2006)
https://doi.org/10.1016/j.apsusc.2006.02.082

Surface and Depth Profiling Investigation of a Drug-Loaded Copolymer Utilized To Coat Taxus Express2 Stents

Robert M. Braun, Juan Cheng, Edward E. Parsonage, Jeff Moeller and Nicholas Winograd
Analytical Chemistry 78 (24) 8347 (2006)
https://doi.org/10.1021/ac0615089

Fragmentation at and above surfaces in SIMS: Effects of biomolecular yield enhancing surface modifications

Stefan L. Luxembourg and Ron M.A. Heeren
International Journal of Mass Spectrometry 253 (3) 181 (2006)
https://doi.org/10.1016/j.ijms.2005.12.048

Advances in time‐of‐flight secondary ion mass spectrometry analysis of protein films

Roger Michel and David G. Castner
Surface and Interface Analysis 38 (11) 1386 (2006)
https://doi.org/10.1002/sia.2382

Understanding Gold−Thiolate Cluster Emission from Self-assembled Monolayers upon Kiloelectronvolt Ion Bombardment

B. Arezki, A. Delcorte, B. J. Garrison and P. Bertrand
The Journal of Physical Chemistry B 110 (13) 6832 (2006)
https://doi.org/10.1021/jp058252f

The influence of the cholesterol microenvironment in tissue sections on molecular ionization efficiencies and distributions in ToF-SIMS

A.F. Maarten Altelaar, Jan van Minnen, Ron M.A. Heeren and Sander R. Piersma
Applied Surface Science 252 (19) 6702 (2006)
https://doi.org/10.1016/j.apsusc.2006.02.266

Microarray Technology and Its Applications

Matthias Vaupel, Andreas Eing, Karl-Otto Greulich, et al.
Biological and Medical Physics, Biomedical Engineering, Microarray Technology and Its Applications 181 (2005)
https://doi.org/10.1007/3-540-26578-3_9

Infrared Mass Spectrometric Imaging below the Diffraction Limit

Stefan L. Luxembourg, Liam A. McDonnell, Todd H. Mize and Ron M. A. Heeren
Journal of Proteome Research 4 (3) 671 (2005)
https://doi.org/10.1021/pr049762+

Static TOF-SIMS — a VAMAS interlaboratory study. Part I. Repeatability and reproducibility of spectra

I. S. Gilmore, M. P. Seah and F. M. Green
Surface and Interface Analysis 37 (8) 651 (2005)
https://doi.org/10.1002/sia.2061

Organic surfaces excited by low-energy ions: atomic collisions, molecular desorption and buckminsterfullerenes

Arnaud Delcorte
Physical Chemistry Chemical Physics 7 (19) 3395 (2005)
https://doi.org/10.1039/b509238h

Natural chemical markers identify source and date of introduction of an exotic species: lake trout (Salvelinus namaycush) in Yellowstone Lake

Andrew R Munro, Thomas E McMahon and James R Ruzycki
Canadian Journal of Fisheries and Aquatic Sciences 62 (1) 79 (2005)
https://doi.org/10.1139/f04-174

Multitechnique Investigation of the Physisorption and Thermal Treatment of Mixed-Metal Clusters on Carbon

Christopher Willocq, Arnaud Delcorte, Sophie Hermans, Patrick Bertrand and Michel Devillers
The Journal of Physical Chemistry B 109 (19) 9482 (2005)
https://doi.org/10.1021/jp050560q

Adhesion Aspects of Thin Films, volume 2

A Delcorte, S Befahy, C Poleunis, M Troosters and P Bertrand
Adhesion Aspects of Thin Films, volume 2 155 (2005)
https://doi.org/10.1201/b12250-15

Spreading and adhesion of ASA on hydrophilic and hydrophobic SiO2

J. Lindfors, S. Ylisuvanto, T. Kallio, J. Laine and P. Stenius
Colloids and Surfaces A: Physicochemical and Engineering Aspects 256 (2-3) 217 (2005)
https://doi.org/10.1016/j.colsurfa.2005.01.028

Subcellular imaging mass spectrometry of brain tissue

Liam A. McDonnell, Sander R. Piersma, A. F. Maarten Altelaar, Todd H. Mize, Stefan L. Luxembourg, Peter D. E. M. Verhaert, Jan van Minnen and Ron M. A. Heeren
Journal of Mass Spectrometry 40 (2) 160 (2005)
https://doi.org/10.1002/jms.735

Metal Salts for Molecular Ion Yield Enhancement in Organic Secondary Ion Mass Spectrometry:  A Critical Assessment

A. Delcorte and P. Bertrand
Analytical Chemistry 77 (7) 2107 (2005)
https://doi.org/10.1021/ac040158s

Investigations of electrospray sample deposition for polymer MALDI mass spectrometry

Scott D. Hanton, Ingrid Z. Hyder, James R. Stets, et al.
Journal of the American Society for Mass Spectrometry 15 (2) 168 (2004)
https://doi.org/10.1016/j.jasms.2003.09.012