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Cited article:

The HOLZ lines in Si[111] zone axis patterns

Gottfried Möllenstedt, Fang Zhou

Microsc. Microanal. Microstruct., 3 2-3 (1992) 221-232

DOI: https://doi.org/10.1051/mmm:0199200302-3022100

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DOI: 10.1016/S0304-3991(96)00088-5
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Voltage and temperature dependence of silicon high-order Laue zone line positions

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Philosophical Magazine B 67 (5) 733 (1993)
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Convergent-beam electron diffraction studies of epitaxial Si/SiO2systems

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Philosophical Magazine A 70 (2) 341 (1994)
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Interpretable resolution of 0.2 nm at 100 kV using electron holography

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