The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).
Cited article:
Gottfried Möllenstedt, Fang Zhou
Microsc. Microanal. Microstruct., 3 2-3 (1992) 221-232
This article has been cited by the following article(s):
Dynamical electron diffraction analysis of lattice parameters, Debye—Waller factors and order in Ti-Al and Ti-Ga alloys
C.J. Rossouw, M.A. Gibson and C.T. Forwood
Ultramicroscopy 66 (3-4) 193 (1996)
DOI: 10.1016/S0304-3991(96)00088-5
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Voltage and temperature dependence of silicon high-order Laue zone line positions
C. J. Rossouw and P. R. Miller
Philosophical Magazine B 67 (5) 733 (1993)
DOI: 10.1080/13642819308219320
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Convergent-beam electron diffraction studies of epitaxial Si/SiO2systems
F. Banhart and N. Nagel
Philosophical Magazine A 70 (2) 341 (1994)
DOI: 10.1080/01418619408243189
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Interpretable resolution of 0.2 nm at 100 kV using electron holography
Alex Harscher, Günter Lang and Hannes Lichte
Ultramicroscopy 58 (1) 79 (1995)
DOI: 10.1016/0304-3991(94)00180-U
See this article