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Cited article:

Structural and analytical characterization of Si1-x Gex /Si heterostructures by Rutherford backscattering spectrometry and channeling, analytical electron microscopy and double crystal X-ray diffractometry

Microsc. Microanal. Microstruct., 3 4 (1992) 363-384
DOI: https://doi.org/10.1051/mmm:0199200304036300

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