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Relativistic EELS scattering cross-sections for microanalysis based on Dirac solutions
Zezhong Zhang, Ivan Lobato, Hamish Brown, Dirk Lamoen, Daen Jannis, Johan Verbeeck, Sandra Van Aert and Peter D. Nellist Ultramicroscopy 269 114083 (2025) https://doi.org/10.1016/j.ultramic.2024.114083
Accurate measurement of absolute experimental inelastic mean free paths and EELS differential cross-sections