Articles citing this article

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Cited article:

Cross characterization by scanning electron microscopy and atomic force microscopy of Ag islands grown on Si (111) 7×7

M. Hanbücken, I. Vianey, F. Palmino, D. Pailharey

Microsc. Microanal. Microstruct., 5 1 (1994) 41-45

DOI: https://doi.org/10.1051/mmm:019940050104100

This article has been cited by the following article(s):

STM study of nucleation of Ag on Si(111)-(7×7) at submonolayer coverage

Pavel Sobotı́k, Ivan Ošt'ádal, Josef Mysliveček and Tomáš Jarolímek
Surface Science 454-456 847 (2000)
DOI: 10.1016/S0039-6028(00)00204-1
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Transition from 2D to 3D growth during Ag/Si(1 1 1)-(7×7) heteroepitaxy

Pavel Sobotı́k, Ivan Ošt’ádal, Josef Mysliveček, Tomáš Jarolı́mek and František Lavický
Surface Science 482-485 797 (2001)
DOI: 10.1016/S0039-6028(00)01085-2
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