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Detection of an evanescent field scattered by silicon tips in an apertureless scanning near-field optical microscope

R. Laddada, S. Benrezzak, P. M. Adam, et al.
The European Physical Journal Applied Physics 6 (2) 171 (1999)
DOI: 10.1051/epjap:1999168
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Polarization contrast with an apertureless near-field optical microscope

P.M. Adam, P. Royer, R. Laddada and J.L. Bijeon
Ultramicroscopy 71 (1-4) 327 (1998)
DOI: 10.1016/S0304-3991(97)00091-0
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A model for the mechanism of field interaction at silicon AFM tips in photon tunneling transfer

Jean-Pierre Fillard, Michel Castagné, Christel Prioleau, Mohamed Benfedda and J. Bonnafe
Ultramicroscopy 61 (1-4) 85 (1995)
DOI: 10.1016/0304-3991(95)00125-5
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Scanning Probe Microscopy

Lawrence A. Bottomley, Joseph E. Coury and Phillip N. First
Analytical Chemistry 68 (12) 185 (1996)
DOI: 10.1021/a1960008+
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