Free Access
| Issue |
Microsc. Microanal. Microstruct.
Volume 5, Number 4-6, August / October / December 1994
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|---|---|---|
| Page(s) | 427 - 433 | |
| DOI | https://doi.org/10.1051/mmm:0199400504-6042700 | |
References of Microsc. Microanal. Microstruct. 5 427-433
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- Bryzek J., Petersen K., McCulley W., "micromachines on the march", IEEE Spectrum (20 mai, 1994).
- Van Hulst N.F., Moers M.H.P., Noordman O.F.J., Tack R.G., Segerink F.B., Bölger B., "Near field optical microscopy using a Silicon Nitride probe", Appl. Phys. Lett .62 (1993) 461. [CrossRef]
- Baida F., Courjon D., Tribillon G., "Combination of a fiber and a Silicon Nitride tip as a bifunctional detector; first results and perspectives", in Near-Field Optics, D.W. Pohl, D. Courjon, Vol. E242 of NATO Series (Kluwer Acad. Pub. Ed. 1992) 71-78.
- Castagné M., Prioleau C., Baudry E., Fillard J.P., Bonnafé J., "Photon tunneling from InP material surface", 6th Int. Conf. InP and rel. Mat. (Santa Barbara, 1994) Comptes rendus à paraitre.
- Castagné M., Prioleau C., Fillard J.P., "An experimental study of the optical properties of SiN AFM tips in Scanning Tunneling Microscopy", Appl. Opt. à paraitre (1994).
- Fillard J.P., Castagné M., 'An intelligent optical scanner", European patent application EP 933057861.
- Tortonese M., Barrett R.C., Quate C.A., 'Atomic resolution with an atomic force microscope using piezoresistive detection" communication privée à paraitre.
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- Fillard J.P., Castagné M., Prioleau C., Baudry E., Gall P., Bonnafé J., "Photon tunneling scanning microscopy and atomic force microscopy on semiconductor surfaces", 2nd Int. Workshop EX-MATEC'94, Parma (1994) Comptes rendus à paraitre.
- Fillard J.P., Castagné M., Prioleau C., "AFM Silicon tips as photon tunneling sensors: a resonant evanescent coupling experiment" Appl. Opt. à paraitre (1994).
- Leviatan Y., "Electromagnetic coupling between two half space regions separated by two slots perforated in parallel conducting screens" IEEE trans. Microwave Theo. Tech. 36 (1988) 1. [CrossRef]
- Hori H., "Quantum optical picture of photon STM and proposal of single atom manipulation", Near field optics, D.W Pohl and D. Courjon Eds., NATO Ser. E242 (1993) 105.
- Mertz J., Hipp M., Mlynek J., Marti O., "Measurement of force induced by an evanescent wave on a semiconductor tip", 2nd Int. Conf. on NFO 2 Raleigh (1993) Comptes rendus à paraitre.