Scanning surface harmonic microscopy: Application to silicon and Langmuir-Blodgett films on silicon
Microsc. Microanal. Microstruct., 5 4-6 (1994) 535-543
Articles citing this article
The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).
Cited article:
This article has been cited by the following article(s):
Microwave-mixing scanning capacitance microscopy of pn junctions
J. Schmidt, D. H. Rapoport, G. Behme and H.-J. FröhlichJournal of Applied Physics 86 (12) 7094 (1999)
https://doi.org/10.1063/1.371797
Microwave-frequency alternating current scanning tunneling microscopy by difference frequency detection: Atomic resolution imaging on graphite
J. Schmidt, D. H. Rapoport and H.-J. FröhlichReview of Scientific Instruments 70 (8) 3377 (1999)
https://doi.org/10.1063/1.1149922
Probing Electronic Properties of Conjugated and Saturated Molecules in Self‐Assembled Monolayers
P. S. WEISS, L. A. BUMM, T. D. DUNBAR, T. P. BURGIN, J. M. TOUR and D. L. ALLARAAnnals of the New York Academy of Sciences 852 (1) 145 (1998)
https://doi.org/10.1111/j.1749-6632.1998.tb09869.x