Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

EPMA Sputter Depth Profiling: A New Technique for Quantitative in-Depth Analysis of Layered Structures

Peter Karduck, Alexander von Richthofen

Microsc. Microanal. Microstruct., 6 4 (1995) 421-432

DOI: https://doi.org/10.1051/mmm:1995132

This article has been cited by the following article(s):

Characterization of a heat-insulating coating on floatglass by sputter-assisted EPMA

Silvia Richter, Norbert Lesch and Peter Karduck
Surface and Interface Analysis 30 (1) 260 (2000)
DOI: 10.1002/1096-9918(200008)30:1<260::AID-SIA818>3.0.CO;2-E
See this article

Composition, binding states, structure, and morphology of the corrosion layer of an oxidized Ti0.46Al0.54N film

A. von Richthofen, R. Cremer, M. Witthaut, R. Domnick and D. Neuschütz
Thin Solid Films 312 (1-2) 190 (1998)
DOI: 10.1016/S0040-6090(97)00728-1
See this article

Chemical characterisation of scale formation of high manganese steels (Fe-Mn23-C0.6) on the sub-micrometre scale: a challenge for EPMA

E Augustyn, B Hallstedt, B Wietbrock, et al.
IOP Conference Series: Materials Science and Engineering 32 012001 (2012)
DOI: 10.1088/1757-899X/32/1/012001
See this article

Modern Developments and Applications in Microbeam Analysis

Peter Karduck
Modern Developments and Applications in Microbeam Analysis 109 (1998)
DOI: 10.1007/978-3-7091-7506-4_16
See this article

Modern Developments and Applications in Microbeam Analysis

Silvia Richter, Norbert Lesch and Peter Karduck
Modern Developments and Applications in Microbeam Analysis 125 (1998)
DOI: 10.1007/978-3-7091-7506-4_17
See this article

Modern Developments and Applications in Microbeam Analysis

Norbert Lesch, Silvia Richter and Peter Karduck
Modern Developments and Applications in Microbeam Analysis 133 (1998)
DOI: 10.1007/978-3-7091-7506-4_18
See this article