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Cited article:

Interpretation of Holographic Contour Maps of Reverse Biased p-n Junctions

Clara Capiluppi, Andrea Migliori, Giulio Pozzi

Microsc. Microanal. Microstruct., 6 5-6 (1995) 647-657

DOI: https://doi.org/10.1051/mmm:1995154

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Phase contrast image simulations for electron holography of magnetic and electric fields

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A bridge between two important problems in optics and electrostatics

R Capelli and G Pozzi
European Journal of Physics 29 (5) 927 (2008)
DOI: 10.1088/0143-0807/29/5/006
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Influence of charged oxide layers on TEM imaging of reverse-biasedp−njunctions

M. Beleggia, P. F. Fazzini, P.G. Merli and G. Pozzi
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DOI: 10.1103/PhysRevB.67.045328
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A Fourier approach to fields and electron optical phase-shifts calculations

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A model for the interpretation of holographic and Lorentz images of tilted reverse-biased p-n junctions in a finite specimen

M. Beleggia, R. Capelli and G. Pozzi
Philosophical Magazine B 80 (5) 1071 (2000)
DOI: 10.1080/01418630008221974
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Electron microscopy of reverse biased p–n junctions

M Beleggia, D Cristofori, P.G Merli and G Pozzi
Micron 31 (3) 231 (2000)
DOI: 10.1016/S0968-4328(99)00088-8
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Electron Microscopy and Holography II

G. Matteucci, G.F. Missiroli and G. Pozzi
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DOI: 10.1016/S1076-5670(02)80053-2
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Advances in Imaging and Electron Physics

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Microscopy, Spectroscopy, Holography and Crystallography with Electrons

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An introduction to off-axis electron holography

P.A. Midgley
Micron 32 (2) 167 (2001)
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Electron optical phase-shifts by Fourier methods: Analytical versus numerical calculations

P.F. Fazzini, G. Pozzi and M. Beleggia
Ultramicroscopy 104 (3-4) 193 (2005)
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On the interpretation of TEM images of p-n junctions a multislice approach

G. Pozzi
Physica Status Solidi (a) 156 (1) K1 (1996)
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Microscopy of Semiconducting Materials 2007

A C Twitchett-Harrison, R E Dunin-Borkowski and P A Midgley
Springer Proceedings in Physics, Microscopy of Semiconducting Materials 2007 120 379 (2008)
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