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Cited article:

Optical near-field data analysis through time–frequency distributions: application to the characterization and separation of the image spectral content by reassignment

Tijani Gharbi, Dominique Barchiesi, Olivier Bergossi, Hervé Wioland and Cédric Richard
Journal of the Optical Society of America A 17 (12) 2513 (2000)
https://doi.org/10.1364/JOSAA.17.002513

Wavelet analysis of near-field data and the resolution problem

D. Barchiesi and T. Gharbi
The European Physical Journal Applied Physics 5 (3) 297 (1999)
https://doi.org/10.1051/epjap:1999142

Characterization of reflection scanning near‐field optical microscopy and scanning tunnelling optical microscopy/photon scanning tunnelling microscopy working in preliminary approach constant height scanning mode

D. Barchiesi
Journal of Microscopy 194 (2-3) 299 (1999)
https://doi.org/10.1046/j.1365-2818.1999.00566.x

Novel scanning near-field optical microscope (SNOM)/scanning confocal optical microscope based on normal force distance regulation and bent etched fiber tips

J. F. Wolf, P. E. Hillner, R. Bilewicz, P. Kölsch and J. P. Rabe
Review of Scientific Instruments 70 (6) 2751 (1999)
https://doi.org/10.1063/1.1149840

Local spectral information in the near field with wavelet analysis and entropy

Dominique Barchiesi and Tijani Gharbi
Applied Optics 38 (31) 6587 (1999)
https://doi.org/10.1364/AO.38.006587

Reflection scanning near-field optical microscopy (R-SNOM) in constant height mode with a dielectric probe Image interpretation and resolution for high topographic variations

Dominique Barchiesi, Olivier Bergossi, Christian Pieralli and Michel Spajer
Ultramicroscopy 71 (1-4) 361 (1998)
https://doi.org/10.1016/S0304-3991(97)00068-5