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Optical near-field data analysis through time–frequency distributions: application to the characterization and separation of the image spectral content by reassignment
Tijani Gharbi, Dominique Barchiesi, Olivier Bergossi, Hervé Wioland and Cédric Richard Journal of the Optical Society of America A 17(12) 2513 (2000) https://doi.org/10.1364/JOSAA.17.002513
Wavelet analysis of near-field data and the resolution problem
Novel scanning near-field optical microscope (SNOM)/scanning confocal optical microscope based on normal force distance regulation and bent etched fiber tips
J. F. Wolf, P. E. Hillner, R. Bilewicz, P. Kölsch and J. P. Rabe Review of Scientific Instruments 70(6) 2751 (1999) https://doi.org/10.1063/1.1149840
Local spectral information in the near field with wavelet analysis and entropy
Reflection scanning near-field optical microscopy (R-SNOM) in constant height mode with a dielectric probe Image interpretation and resolution for high topographic variations