Articles citing this article

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Cited article:

Quantitative EELS by Spectrum Parametrization

Abdelaziz Aitouchen, Yolande Kihn, Gérald Zanchi

Microsc. Microanal. Microstruct., 8 6 (1997) 369-378

DOI: https://doi.org/10.1051/mmm:1997128

This article has been cited by the following article(s):

Ostwald ripening of Ge precipitates elaborated by ion implantation in SiO2

C Bonafos, B Garrido, M Lopez, et al.
Materials Science and Engineering: B 69-70 380 (2000)
https://doi.org/10.1016/S0921-5107(99)00411-0

An electron microscopy study of the growth of Ge nanoparticles in SiO2

C. Bonafos, B. Garrido, M. Lopez, A. Perez-Rodriguez, J. R. Morante, Y. Kihn, G. Ben Assayag and A. Claverie
Applied Physics Letters 76 (26) 3962 (2000)
https://doi.org/10.1063/1.126835