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Multimodal imaging technology by integrated scanning electron, force, and microwave microscopy and its application to study microscaled capacitors
Olaf C. Haenssler, Sergej Fatikow and Didier Theron Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 36(2) (2018) https://doi.org/10.1116/1.5006161
Olaf C. Haenssler and Sergej Fatikow 1 (2015) https://doi.org/10.1109/IRMMW-THz.2015.7327755
Effects of local electric surface potential on holes charging process in uncapped germanium nanocrystal
Ge nanocrystals with highly uniform size distribution deposited on alumina at room temperature by pulsed laser deposition: structural, morphological, and charge trapping properties
Electron beam energy and Ge nanocrystal size effects on the minority carrier diffusion length measured by the nano-electron beam induced current technique
Influence of electron irradiation on the electronic transport mechanisms during the conductive AFM imaging of InAs/GaAs quantum dots capped with a thin GaAs layer
Vinzenz Friedli, Samuel Hoffmann, Johann Michler and Ivo Utke Nano Science and Technolgy, Applied Scanning Probe Methods VIII 247 (2008) https://doi.org/10.1007/978-3-540-74080-3_7
Local electronic transport through InAs/InP(0 0 1) quantum dots capped with a thin InP layer studied by an AFM conductive probe
Imaging the electric properties of InAs∕InP(001) quantum dots capped with a thin InP layer by conductive atomic force microscopy: Evidence of memory effect
Measurement of mechanical properties of three-dimensional nanometric objects by an atomic force microscope incorporated in a scanning electron microscope
Kimitake Fukushima, Shigeki Kawai, Daisuke Saya and Hideki Kawakatsu Review of Scientific Instruments 73(7) 2647 (2002) https://doi.org/10.1063/1.1488150
AFM mechanical mapping at the interface between a bioactive glass coating and bone
Resolution in scanning near-field cathodoluminescence microscopy
D. Pastré, J. L. Bubendorff and M. Troyon Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 18(3) 1138 (2000) https://doi.org/10.1116/1.591349
Improvement of near-field fluorescence imaging of bulk materials by metal coating