Microscopy Microanalysis Microstructures

EDPS Account

Search

The parameterless correction method in X-ray microanalysis

Eric Van Cappellen

Microsc. Microanal. Microstruct., 1 1 (1990) 1-22

DOI: 10.1051/mmm:01990001010100

This search tool will display articles in Google Scholar database by authors of the selected article:

Select your author(s):

Eric Van Cappellen

Search method:

Articles written by ALL the selected authors (AND)

Articles written by ANY OF the selected authors (OR)